Full text
|
PDF
- Requires a PDF viewer, such as GSview, Xpdf or Adobe Acrobat Reader
Download (2MB) | Preview |
Crespillo Almenara, Miguel and Peña Rodríguez, Ovidio Y. and Manzano Santamaría, Javier and Rivera de Mena, Antonio and Jimenez Rey, D. and Agullo Lopez, Fernando (2012). In-situ optical reflectance characterization of ion beam irradiation damage on crystalline (quartz) and amorphous (silica) SiO2. In: "18th International Conference on Ion Beam Modifications of Materials (IBMM 2012)", 02/09/2012 - 07/09/2012, Quingdao, China. pp. 1-32.
Title: | In-situ optical reflectance characterization of ion beam irradiation damage on crystalline (quartz) and amorphous (silica) SiO2 |
---|---|
Author/s: |
|
Item Type: | Presentation at Congress or Conference (Speech) |
Event Title: | 18th International Conference on Ion Beam Modifications of Materials (IBMM 2012) |
Event Dates: | 02/09/2012 - 07/09/2012 |
Event Location: | Quingdao, China |
Title of Book: | 18th International Conference on Ion Beam Modifications of Materials (IBMM 2012) |
Date: | 2012 |
Subjects: | |
Faculty: | E.T.S.I. Industriales (UPM) |
Department: | Ingeniería Nuclear [hasta 2014] |
Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
|
PDF
- Requires a PDF viewer, such as GSview, Xpdf or Adobe Acrobat Reader
Download (2MB) | Preview |
Outline: • Motivation, aim • Complement waveguide data on silica • Optical data in quartz • Detailed analysis, i.e. both fluence kinetics and resolution • Efficiency of irradiation and analysis, samples, time... • Experimental set-up description • Reflectance procedure • Options: light source (lasers, white light..), detectors, configurations • Results and discussion • Comparative of amorphous and crystalline phases
Item ID: | 19680 |
---|---|
DC Identifier: | https://oa.upm.es/19680/ |
OAI Identifier: | oai:oa.upm.es:19680 |
Deposited by: | Memoria Investigacion |
Deposited on: | 08 Feb 2014 14:19 |
Last Modified: | 30 May 2017 16:11 |