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In-situ optical reflectance characterization of ion beam irradiation damage on crystalline (quartz) and amorphous (silica) SiO2
Citation
Crespillo Almenara, Miguel and Peña Rodríguez, Ovidio Y. and Manzano Santamaría, Javier and Rivera de Mena, Antonio and Jimenez Rey, D. and Agullo Lopez, Fernando (2012). In-situ optical reflectance characterization of ion beam irradiation damage on crystalline (quartz) and amorphous (silica) SiO2. In: "18th International Conference on Ion Beam Modifications of Materials (IBMM 2012)", 02/09/2012 - 07/09/2012, Quingdao, China. pp. 1-32.
Description
| Title: | In-situ optical reflectance characterization of ion beam irradiation damage on crystalline (quartz) and amorphous (silica) SiO2 |
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| Author/s: |
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| Item Type: | Presentation at Congress or Conference (Speech) |
| Event Title: | 18th International Conference on Ion Beam Modifications of Materials (IBMM 2012) |
| Event Dates: | 02/09/2012 - 07/09/2012 |
| Event Location: | Quingdao, China |
| Title of Book: | 18th International Conference on Ion Beam Modifications of Materials (IBMM 2012) |
| Date: | 2012 |
| Subjects: | |
| Faculty: | E.T.S.I. Industriales (UPM) |
| Department: | Ingeniería Nuclear [hasta 2014] |
| Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
Abstract
Outline: • Motivation, aim • Complement waveguide data on silica • Optical data in quartz • Detailed analysis, i.e. both fluence kinetics and resolution • Efficiency of irradiation and analysis, samples, time... • Experimental set-up description • Reflectance procedure • Options: light source (lasers, white light..), detectors, configurations • Results and discussion • Comparative of amorphous and crystalline phases
More information
| Item ID: | 19680 |
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| DC Identifier: | https://oa.upm.es/19680/ |
| OAI Identifier: | oai:oa.upm.es:19680 |
| Deposited by: | Memoria Investigacion |
| Deposited on: | 08 Feb 2014 14:19 |
| Last Modified: | 30 May 2017 16:11 |
