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Celeste Vega, Nadia, Tirado, Mónica, Comedi, David, Rodríguez Domínguez, Andrés, Rodríguez Rodríguez, Tomás, Hughes, Gareth M., Grovenor, Chris R.M. and Audebert, Fernando (2012). Electrical, photoelectrical and morphological properties of ZnO nanowire networks grown on SiO2 and on Si. In: "Materials Research Sao Paulo 2011", 30/09/2011 - 02/10/2011, Sao Paulo, Brasil. pp. 1-6.
Title: | Electrical, photoelectrical and morphological properties of ZnO nanowire networks grown on SiO2 and on Si |
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Author/s: |
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Item Type: | Presentation at Congress or Conference (Article) |
Event Title: | Materials Research Sao Paulo 2011 |
Event Dates: | 30/09/2011 - 02/10/2011 |
Event Location: | Sao Paulo, Brasil |
Title of Book: | Materials Research |
Date: | December 2012 |
Volume: | 16 |
Subjects: | |
Freetext Keywords: | nanostructures, semiconductors, ZnO, photoluminescence, photoconductivity |
Faculty: | E.T.S.I. Telecomunicación (UPM) |
Department: | Tecnología Electrónica [hasta 2014] |
Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
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ZnO nanofibre networks (NFNs) were grown by vapour transport method on Si-based substrates. One type of substrate was SiO2 thermally grown on Si and another consisted of a Si wafer onto which Si nanowires (NWs) had been grown having Au nanoparticles catalysts. The ZnO-NFN morphology was observed by scanning electron microscopy on samples grown at 600 °C and 720 °C substrate temperature, while an focused ion beam was used to study the ZnO NFN/Si NWs/Si and ZnO NFN/SiO2 interfaces. Photoluminescence, electrical conductance and photoconductance of ZnO-NFN was studied for the sample grown on SiO2. The photoluminescence spectra show strong peaks due to exciton recombination and lattice defects. The ZnO-NFN presents quasi-persistent photoconductivity effects and ohmic I-V characteristics which become nonlinear and hysteretic as the applied voltage is increased. The electrical conductance as a function of temperature can be described by a modified three dimensional variable hopping model with nanometer-ranged typical hopping distances.
Item ID: | 20104 |
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DC Identifier: | https://oa.upm.es/20104/ |
OAI Identifier: | oai:oa.upm.es:20104 |
Official URL: | http://www.scielo.br/scielo.php?pid=S1516-14392013... |
Deposited by: | Memoria Investigacion |
Deposited on: | 29 Sep 2013 10:44 |
Last Modified: | 21 Apr 2016 22:29 |