Full text
Preview |
PDF
- Requires a PDF viewer, such as GSview, Xpdf or Adobe Acrobat Reader
Download (429kB) | Preview |
Did you evaluate your ontology? OOPS! (OntOlogy Pitfall Scanner!)
Citation
Poveda Villalon, Maria and Suárez-Figueroa, Mari Carmen and Gómez-Pérez, A. (2012). Did you evaluate your ontology? OOPS! (OntOlogy Pitfall Scanner!). In: "18th International Conference, EKAW 2012", 08/10/2012 - 12/10/2012, Galway City, Ireland. pp..
Description
| Title: | Did you evaluate your ontology? OOPS! (OntOlogy Pitfall Scanner!) |
|---|---|
| Author/s: |
|
| Item Type: | Presentation at Congress or Conference (Poster) |
| Event Title: | 18th International Conference, EKAW 2012 |
| Event Dates: | 08/10/2012 - 12/10/2012 |
| Event Location: | Galway City, Ireland |
| Title of Book: | Proceedings 18th International Conference, EKAW 2012 |
| Date: | 2012 |
| Subjects: | |
| Faculty: | Facultad de Informática (UPM) |
| Department: | Inteligencia Artificial |
| Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
Abstract
The application of methodologies for building ontologies can improve ontology quality. However, such quality is not guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or bad practices within the ontology development. In this context, our aim is to describe OOPS!(OntOlogy Pitfall Scanner!), a tool for detecting pitfalls in ontologies.
More information
| Item ID: | 20287 |
|---|---|
| DC Identifier: | https://oa.upm.es/20287/ |
| OAI Identifier: | oai:oa.upm.es:20287 |
| Deposited by: | Memoria Investigacion |
| Deposited on: | 23 Oct 2013 14:55 |
| Last Modified: | 20 Feb 2023 08:51 |
