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Izpura Torres, José Ignacio (2008). 1/f Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance. "IEEE Transactions on Instrumentation and Measurement", v. 57 (n. 3); pp. 509-517. ISSN 0018-9456. https://doi.org/10.1109/TIM.2007.911642.
Title: | 1/f Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance |
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Author/s: |
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Item Type: | Article |
Título de Revista/Publicación: | IEEE Transactions on Instrumentation and Measurement |
Date: | March 2008 |
ISSN: | 0018-9456 |
Volume: | 57 |
Subjects: | |
Freetext Keywords: | backgating noise capacitor electrical noise floating conducting layer instrumental disturbance planar resistors thermal equilibrium thermal voltage noise |
Faculty: | E.T.S.I. Telecomunicación (UPM) |
Department: | Ingeniería Electrónica |
Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
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Any planar resistor (channel) close to a conducting layer left floating (gate) forms a capacitor C whose thermal voltage noise (kT/C noise) has a backgating effect on the sheet resistance of the channel that is a powerful source of 1/f resistance noise in planar resistors and, hence, in planar devices. This 1/f spectrum is created by the bias voltage V DS applied to the resistor, which is a disturbance that takes it out of thermal equilibrium and changes the resistance noise that existed in the unbiased device. This theory, which gives the first electrical explanation for 1/f electrical noise, not only gives a theoretical basis for the Hooge's formula but also allows the design of proper shields to reduce 1/f noise.
Item ID: | 2038 |
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DC Identifier: | https://oa.upm.es/2038/ |
OAI Identifier: | oai:oa.upm.es:2038 |
DOI: | 10.1109/TIM.2007.911642 |
Official URL: | http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4447379&arnumber=4413160&count=26&index=6 |
Deposited by: | Memoria Investigacion |
Deposited on: | 04 Jan 2010 09:04 |
Last Modified: | 20 Apr 2016 11:50 |