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Sánchez Margallo, Juan Antonio and Sánchez Margallo, Francisco Miguel and Pagador Carrasco, J.B. and Oropesa García, Ignacio and Lucas Hernandez, Marcos and Gómez Aguilera, Enrique J. and Moreno del Pozo, Jose (2012). Technical evaluation of a third generation optical pose tracker for motion analysis and image-guided surgery. In: "15th International Conference on Medical Image Computing and Computer Assisted Intervention (MICCAI 2012)", 01/10/2012 - 05/10/2012, Niza, Francia. pp..
Title: | Technical evaluation of a third generation optical pose tracker for motion analysis and image-guided surgery |
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Author/s: |
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Item Type: | Presentation at Congress or Conference (Article) |
Event Title: | 15th International Conference on Medical Image Computing and Computer Assisted Intervention (MICCAI 2012) |
Event Dates: | 01/10/2012 - 05/10/2012 |
Event Location: | Niza, Francia |
Title of Book: | International Conference on Medical Image Computing and Computer Assisted Intervention (MICCAI 2012) |
Date: | 2012 |
Subjects: | |
Freetext Keywords: | Laparoscopic tool tracking, Optical pose tracker, Motion analysis, Image-guided surgery. |
Faculty: | E.T.S.I. Telecomunicación (UPM) |
Department: | Tecnología Fotónica [hasta 2014] |
Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
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Laparoscopic instrument tracking systems are an essential component in image-guided interventions and offer new possibilities to improve and automate objective assessment methods of surgical skills. In this study we present our system design to apply a third generation optical pose tracker (Micron- Tracker®) to laparoscopic practice. A technical evaluation of this design is performed in order to analyze its accuracy in computing the laparoscopic instrument tip position. Results show a stable fluctuation error over the entire analyzed workspace. The relative position errors are 1.776±1.675 mm, 1.817±1.762 mm, 1.854±1.740 mm, 2.455±2.164 mm, 2.545±2.496 mm, 2.764±2.342 mm, 2.512±2.493 mm for distances of 50, 100, 150, 200, 250, 300, and 350 mm, respectively. The accumulated distance error increases with the measured distance. The instrument inclination covered by the system is high, from 90 to 7.5 degrees. The system reports a low positional accuracy for the instrument tip.
Item ID: | 20434 |
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DC Identifier: | https://oa.upm.es/20434/ |
OAI Identifier: | oai:oa.upm.es:20434 |
Deposited by: | Memoria Investigacion |
Deposited on: | 06 Oct 2013 10:11 |
Last Modified: | 21 Apr 2016 23:14 |