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Ion-beam damage induced in SiO2: Excitonic mechanisms under heavy electronic excitation
Citation
Agullo Lopez, Fernando and Olivares, J. and Rivera de Mena, Antonio and Peña Rodríguez, Ovidio Y. and Manzano-Santamaría, J. and Crespillo Almenara, Miguel (2012). Ion-beam damage induced in SiO2: Excitonic mechanisms under heavy electronic excitation. In: "2º Workshop Programa TechnoFusión", 18/06/2012 - 19/06/2012, Madrid, España. pp. 1-11.
Description
| Title: | Ion-beam damage induced in SiO2: Excitonic mechanisms under heavy electronic excitation |
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| Author/s: |
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| Item Type: | Presentation at Congress or Conference (Article) |
| Event Title: | 2º Workshop Programa TechnoFusión |
| Event Dates: | 18/06/2012 - 19/06/2012 |
| Event Location: | Madrid, España |
| Title of Book: | 2º Workshop Programa TechnoFusión |
| Date: | June 2012 |
| Subjects: | |
| Faculty: | Instituto de Fusión Nuclear (UPM) |
| Department: | Otro |
| Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
Abstract
The Centro de Micro-Análisis de Materiales (CMAM) in the Universidad Autónoma de Madrid is carrying out an extensive research program on the processes induced by high energy heavy mass ions (SHI) on dielectric materials and their photonic applications [1?21]. A significant part of this activity constitutes a relevant contribution to the scientific program associated to the TECHNOFUSION project. It is performed in collaboration with the Instituto de Fusion Nuclear at the UPM, the CIEMAT, the Departamento de Física de Materiales at UAM and several other national institutions (INTA) and international laboratories (GANIL, France), Legnaro Italy, Grenoble?. The program has led to a large number of publications in reputed international journals.
More information
| Item ID: | 20457 |
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| DC Identifier: | https://oa.upm.es/20457/ |
| OAI Identifier: | oai:oa.upm.es:20457 |
| Official URL: | http://programa-technofusion.ciemat.es/TECHNOFUSIO... |
| Deposited by: | Memoria Investigacion |
| Deposited on: | 05 Nov 2013 19:39 |
| Last Modified: | 30 May 2017 16:09 |
