Full text
|
PDF
- Requires a PDF viewer, such as GSview, Xpdf or Adobe Acrobat Reader
Download (1MB) | Preview |
Ituero Herrero, Pablo and Garcia-Redondo, Fernando and López Vallejo, Marisa (2012). Temperature Sensor Placement Including Routing Overhead and Sampling Inaccuracies. In: "2012 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2012 International Conference on", 19/09/2012 - 21/09/2012, Sevilla. ISBN 978-1-4673-0685-0. pp. 69-72. https://doi.org/10.1109/SMACD.2012.6339419.
Title: | Temperature Sensor Placement Including Routing Overhead and Sampling Inaccuracies |
---|---|
Author/s: |
|
Item Type: | Presentation at Congress or Conference (Article) |
Event Title: | 2012 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2012 International Conference on |
Event Dates: | 19/09/2012 - 21/09/2012 |
Event Location: | Sevilla |
Title of Book: | 2012 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) |
Date: | September 2012 |
ISBN: | 978-1-4673-0685-0 |
Subjects: | |
Freetext Keywords: | Accuracy, Monitoring, Resource management, Temperature measurement, Temperature sensors |
Faculty: | E.T.S.I. Telecomunicación (UPM) |
Department: | Ingeniería Electrónica |
Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
|
PDF
- Requires a PDF viewer, such as GSview, Xpdf or Adobe Acrobat Reader
Download (1MB) | Preview |
Dynamic thermal management techniques require a collection of on-chip thermal sensors that imply a significant area and power overhead. Finding the optimum number of temperature monitors and their location on the chip surface to optimize accuracy is an NP-hard problem. In this work we improve the modeling of the problem by including area, power and networking constraints along with the consideration of three inaccuracy terms: spatial errors, sampling rate errors and monitor-inherent errors. The problem is solved by the simulated annealing algorithm. We apply the algorithm to a test case employing three different types of monitors to highlight the importance of the different metrics. Finally we present a case study of the Alpha 21364 processor under two different constraint scenarios.
Item ID: | 20503 |
---|---|
DC Identifier: | https://oa.upm.es/20503/ |
OAI Identifier: | oai:oa.upm.es:20503 |
DOI: | 10.1109/SMACD.2012.6339419 |
Official URL: | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6339419 |
Deposited by: | Memoria Investigacion |
Deposited on: | 07 Oct 2013 17:03 |
Last Modified: | 21 Apr 2016 23:20 |