OOPS! (OntOlogy Pitfall Scanner!): an on-line tool for ontology evaluation

Poveda Villalón, María and Gómez Pérez, Asunción de María and Suárez-Figueroa, Mari Carmen (2014). OOPS! (OntOlogy Pitfall Scanner!): an on-line tool for ontology evaluation. "International Journal on Semantic Web and Information Systems", v. 10 (n. 2); pp. 7-34. ISSN 1552-6283. https://doi.org/10.4018/ijswis.2014040102.

Description

Title: OOPS! (OntOlogy Pitfall Scanner!): an on-line tool for ontology evaluation
Author/s:
  • Poveda Villalón, María
  • Gómez Pérez, Asunción de María
  • Suárez-Figueroa, Mari Carmen
Item Type: Article
Título de Revista/Publicación: International Journal on Semantic Web and Information Systems
Date: April 2014
ISSN: 1552-6283
Volume: 10
Subjects:
Freetext Keywords: Ontology, Ontology evaluation, Ontology quality, Ontology validation, Pitfalls
Faculty: E.T.S. de Ingenieros Informáticos (UPM)
Department: Inteligencia Artificial
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

This paper presents two contributions to the field of Ontology Evaluation. First, a live catalogue of pitfalls that extends previous works on modeling errors with new pitfalls resulting from an empirical analysis of over 693 ontologies. Such a catalogue classifies pitfalls according to the Structural, Functional and Usability- Profiling dimensions. For each pitfall, we incorporate the value of its importance level (critical, important and minor) and the number of ontologies where each pitfall has been detected. Second, OOPS! (OntOlogy Pitfall Scanner!), a tool for detecting pitfalls in ontologies and targeted at newcomers and domain experts unfamiliar with description logics and ontology implementation languages. The tool operates independently of any ontology development platform and is available online. The evaluation of the system is provided both through a survey of users’ satisfaction and worldwide usage statistics. In addition, the system is also compared with existing ontology evaluation tools in terms of coverage of pitfalls detected.

Funding Projects

TypeCodeAcronymLeaderTitle
Government of SpainTIN2013- 46238-C4-2-RUnspecifiedUniversidad Politécnica de Madrid4V: volumen, velocidad, variedad y validez en la gestión innovadora de datos

More information

Item ID: 35873
DC Identifier: https://oa.upm.es/35873/
OAI Identifier: oai:oa.upm.es:35873
DOI: 10.4018/ijswis.2014040102
Official URL: http://www.igi-global.com/article/oops-ontology-pitfall-scanner/116450
Deposited by: Memoria Investigacion
Deposited on: 18 May 2016 14:37
Last Modified: 10 May 2021 08:36
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