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Otón Martínez, Eva, López de Andrés, Sol, Bennis, Noureddine, Otón Sánchez, José Manuel ORCID: https://orcid.org/0000-0001-8070-9180 and Geday, Morten Andreas
ORCID: https://orcid.org/0000-0002-5625-1162
(2014).
Silicon oxides as alignment surfaces for vertically-aligned nematics in photonic devices.
"Opto-Electronics Review", v. 22
(n. 2);
pp. 92-100.
ISSN 1230-3402.
https://doi.org/10.2478/s11772-014-0182-2.
Title: | Silicon oxides as alignment surfaces for vertically-aligned nematics in photonic devices |
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Author/s: |
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Item Type: | Article |
Título de Revista/Publicación: | Opto-Electronics Review |
Date: | June 2014 |
ISSN: | 1230-3402 |
Volume: | 22 |
Subjects: | |
Freetext Keywords: | SiOx, SiO2, silicon oxides, vertically aligned nematics, photonic devices, morphology characterization |
Faculty: | E.T.S.I. Telecomunicación (UPM) |
Department: | Tecnología Fotónica y Bioingeniería |
Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
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A comparative study on alignment performance and microstructure of inorganic layers used for liquid crystal cell conditioning has been carried out. The study has focused on two specific materials, SiOx and SiO2, deposited under different conditions. The purpose was to establish a relationship between layer microstructure and liquid crystal alignment. The surface morphology has been studied by FESEM and AFM. An analysis on liquid crystal alignment, pretilt angle, response time, contrast ratio and the conditions to develop backflow effect (significant rise time increase due to pure homeotropic alignment) on vertically-aligned nematic cells has been carried out. A technique to overcome the presence of backflow has been identified. The full comparative study of SiOx and SiO2 layer properties and their influence over liquid crystal alignment and electrooptic response is presented.
Item ID: | 37378 |
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DC Identifier: | https://oa.upm.es/37378/ |
OAI Identifier: | oai:oa.upm.es:37378 |
DOI: | 10.2478/s11772-014-0182-2 |
Official URL: | http://link.springer.com/article/10.2478%2Fs11772-... |
Deposited by: | Memoria Investigacion |
Deposited on: | 02 Sep 2015 16:34 |
Last Modified: | 30 Nov 2022 09:00 |