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Herrero Martin, Rebeca ORCID: https://orcid.org/0000-0003-4309-6084, Askins, Stephen
ORCID: https://orcid.org/0000-0002-9988-2917, Anton Hernandez, Ignacio
ORCID: https://orcid.org/0000-0002-6890-5477, Sala Pano, Gabriel
ORCID: https://orcid.org/0000-0002-7016-3564, Araki, Kenji and Nagai, Hirokazu
(2014).
Module optical analyzer: Identification of defects on the production line.
In: "10th International Conference on Concentrator Photovoltaic Systems (CPV-10)", 07/04/2014 - 09/04/2014, Albuquerque, New Mexico, USA. pp. 119-123.
https://doi.org/10.1063/1.4897042.
Title: | Module optical analyzer: Identification of defects on the production line |
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Author/s: |
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Item Type: | Presentation at Congress or Conference (Article) |
Event Title: | 10th International Conference on Concentrator Photovoltaic Systems (CPV-10) |
Event Dates: | 07/04/2014 - 09/04/2014 |
Event Location: | Albuquerque, New Mexico, USA |
Title of Book: | 10th International Conference on Concentrator Photovoltaic Systems (CPV-10) |
Título de Revista/Publicación: | AIP Conference Proceedings |
Date: | 2014 |
ISSN: | 0094-243X |
Subjects: | |
Freetext Keywords: | Solar concentrators, characterization, CCD |
Faculty: | Instituto de Energía Solar (IES) (UPM) |
Department: | Electrónica Física |
Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
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The usefulness of the module optical analyzer when identifying module defects on production line is presented in this paper. Two different case studies performed with two different kind of CPV modules are presented to show the use of MOA both in IES-UPM and Daido Steel facilities.
Item ID: | 38845 |
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DC Identifier: | https://oa.upm.es/38845/ |
OAI Identifier: | oai:oa.upm.es:38845 |
DOI: | 10.1063/1.4897042 |
Deposited by: | Memoria Investigacion |
Deposited on: | 18 Jan 2016 17:31 |
Last Modified: | 30 Nov 2022 09:00 |