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Evaluation of device reliability based on accelerated tests
Citation
Nogueira Díaz, Eduardo and Vázquez López, Manuel and Rodríguez Cano, David (2008). Evaluation of device reliability based on accelerated tests. In: "18th European Safety and Reliability Conference (ESREL 2008)", 22/09/2008-25/09/2008, Valencia, España. ISBN 978-0-415-48513-5.
Description
| Title: | Evaluation of device reliability based on accelerated tests |
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| Author/s: |
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| Item Type: | Presentation at Congress or Conference (Article) |
| Event Title: | 18th European Safety and Reliability Conference (ESREL 2008) |
| Event Dates: | 22/09/2008-25/09/2008 |
| Event Location: | Valencia, España |
| Title of Book: | Safety, Reliability and Risk Analysis : Theory, Methods and Applications |
| Date: | 2008 |
| ISBN: | 978-0-415-48513-5 |
| Subjects: | |
| Faculty: | E.U.I.T. Telecomunicación (UPM) |
| Department: | Electrónica Física |
| Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
Abstract
Reliability evaluation based on degradation is very useful in systems with scarce failures. In this paper a new degradation model based on Weibull distribution is proposed. The model is applied to the degradation of Light Emitting Diodes (LEDs) under different accelerated tests. The results of these tests are in agreement with the proposed model and reliability function is evaluated.
More information
| Item ID: | 3903 |
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| DC Identifier: | https://oa.upm.es/3903/ |
| OAI Identifier: | oai:oa.upm.es:3903 |
| Official URL: | http://www.taylorandfrancis.com/books/details/9780415485135/ |
| Deposited by: | Memoria Investigacion |
| Deposited on: | 28 Jul 2010 11:31 |
| Last Modified: | 20 Apr 2016 13:19 |
