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Nogueira Díaz, Eduardo and Orlando, Vincenzo and Ochoa Serna, Javier and Fernandez, A. and Vazquez Lopez, Manuel (2016). Accelerated life test of high luminosity blue LEDs. "Microelectronics Reliability", v. 64 ; pp. 631-634. ISSN 0026-2714. https://doi.org/10.1016/j.microrel.2016.07.021.
Title: | Accelerated life test of high luminosity blue LEDs |
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Author/s: |
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Item Type: | Article |
Título de Revista/Publicación: | Microelectronics Reliability |
Date: | 18 September 2016 |
ISSN: | 0026-2714 |
Volume: | 64 |
Subjects: | |
Freetext Keywords: | LED, Accelerated Life Test, Life models, Reliability |
Faculty: | E.T.S.I. Telecomunicación (UPM) |
Department: | Electrónica Física |
Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
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A complete Accelerated Life Test on high luminosity blue LEDs is presented. The test was conducted at different temperatures, humidity and current conditions, involving a total of seven individual tests. Life models were obtained for the catastrophic failures of the tests and then a complete temperature, humidity and current model was developed,which enabled the calculation of the life of the LEDs for any of these conditions. Catastrophic failures and model parameters were consistent with earlier results using different high luminosity LEDs. Non-catastrophic failures were modelled with their corresponding luminous power loss on each test, with expected results.
Item ID: | 45997 |
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DC Identifier: | https://oa.upm.es/45997/ |
OAI Identifier: | oai:oa.upm.es:45997 |
DOI: | 10.1016/j.microrel.2016.07.021 |
Official URL: | http://www.sciencedirect.com/science/article/pii/S0026271416301627 |
Deposited by: | Memoria Investigacion |
Deposited on: | 24 May 2017 18:30 |
Last Modified: | 19 Sep 2018 22:30 |