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Needleman, David Berney and Augusto, André and Peral Boiza, Ana and Bowden, Stuart G. and Cañizo Nadal, Carlos del and Buonassisi, Tonio (2016). Thin absorbers for defect-tolerant solar cell design. In: "2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)", 05/06/2016 - 10/06/2016, Portland, OR, USA. pp. 606-610. https://doi.org/10.1109/PVSC.2016.7749669.
Title: | Thin absorbers for defect-tolerant solar cell design |
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Author/s: |
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Item Type: | Presentation at Congress or Conference (Article) |
Event Title: | 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) |
Event Dates: | 05/06/2016 - 10/06/2016 |
Event Location: | Portland, OR, USA |
Title of Book: | 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) |
Date: | November 2016 |
Subjects: | |
Freetext Keywords: | Silicon, photovoltaic cells, heterojunction |
Faculty: | Instituto de Energía Solar (IES) (UPM) |
Department: | Electrónica Física |
Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
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Thin silicon wafers provide a pathway to lower cost and lower capital intensity PV module manufacturing. They can also produce higher-efficiency devices with less expensive feedstock and crystallization processes because they require shorter diffusion lengths and operate at higher carrier injection. Through simulation, we show that thin Si wafers can be incorporated into high-efficiency cells with greater defect tolerance than thick wafers. Experimentally, we demonstrate the importance of excellent surface passivation to realizing the efficiency potential of thin silicon solar cells and show that such passivation can be achieved in silicon/amorphous silicon heterojunction devices.
Type | Code | Acronym | Leader | Title |
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Government of Spain | ENE2014-56069-C4-2-R | Unspecified | Unspecified | Unspecified |
Item ID: | 46732 |
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DC Identifier: | https://oa.upm.es/46732/ |
OAI Identifier: | oai:oa.upm.es:46732 |
DOI: | 10.1109/PVSC.2016.7749669 |
Official URL: | https://ieeexplore.ieee.org/document/7749669 |
Deposited by: | Memoria Investigacion |
Deposited on: | 19 Apr 2021 14:21 |
Last Modified: | 19 Apr 2021 14:21 |