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Poveda Villalon, Maria and Suárez-Figueroa, Mari Carmen and Gómez-Pérez, A. (2010). A Double Classification of Common Pitfalls in Ontologies. In: "Workshop on Ontology Quality (OntoQual 2010), Co-located with EKAW 2010", October 15, 2010, Lisbon, Portugal. ISBN ISSN 1613-0073.
Title: | A Double Classification of Common Pitfalls in Ontologies |
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Author/s: |
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Item Type: | Presentation at Congress or Conference (Article) |
Event Title: | Workshop on Ontology Quality (OntoQual 2010), Co-located with EKAW 2010 |
Event Dates: | October 15, 2010 |
Event Location: | Lisbon, Portugal |
Title of Book: | Proceedings of Workshop on Ontology Quality (OntoQual 2010), Co-located with EKAW 2010 |
Date: | October 2010 |
ISBN: | ISSN 1613-0073 |
Subjects: | |
Freetext Keywords: | oeg |
Faculty: | Facultad de Informática (UPM) |
Department: | Inteligencia Artificial |
UPM's Research Group: | Ontology Engineering Group – OEG |
Creative Commons Licenses: | None |
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The application of methodologies for building ontologies has improved the ontology quality. However, such a quality is not totally guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or worst practices in the modelling. In this context, our aim in this paper is twofold: (1) to provide a catalogue of common worst practices, which we call pitfalls, and (2) to present a double classification of such pitfalls. These two products will serve in the ontology development in two ways: (a) to avoid the appearance of pitfalls in the ontology modelling, and (b) to evaluate and correct ontologies to improve their quality.
Item ID: | 5413 |
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DC Identifier: | https://oa.upm.es/5413/ |
OAI Identifier: | oai:oa.upm.es:5413 |
Deposited by: | Dr Oscar Corcho |
Deposited on: | 14 Dec 2010 11:20 |
Last Modified: | 20 Apr 2016 14:13 |