Dissociative photoionization of the NO molecule studied by photoelectron-photon coincidence technique

Kivimäki, A., Alvarez Ruiz, Jesus, Coreno, M., Simone, M. de, Moise, A., Partanen, L., Richter, R. and Stankiewicz, M. (2010). Dissociative photoionization of the NO molecule studied by photoelectron-photon coincidence technique. "Journal of Electron Spectroscopy and Related Phenomena", v. 182 (n. 1-2); pp. 63-69. ISSN 0368-2048. https://doi.org/10.1016/j.elspec.2010.07.003.

Description

Title: Dissociative photoionization of the NO molecule studied by photoelectron-photon coincidence technique
Author/s:
  • Kivimäki, A.
  • Alvarez Ruiz, Jesus
  • Coreno, M.
  • Simone, M. de
  • Moise, A.
  • Partanen, L.
  • Richter, R.
  • Stankiewicz, M.
Item Type: Article
Título de Revista/Publicación: Journal of Electron Spectroscopy and Related Phenomena
Date: November 2010
ISSN: 0368-2048
Volume: 182
Subjects:
Freetext Keywords: Nitric oxide; Photoelectron–photon coincidence; Inner valence; Dissociative photoionization; Vacuum ultraviolet emission
Faculty: Otros Centros UPM
Department: Otro
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

Low-energy photoelectron–vacuum ultraviolet (VUV) photon coincidences have been measured using synchrotron radiation excitation in the inner-valence region of the nitric oxide molecule. The capabilities of the coincidence set-up were demonstrated by detecting the 2s−1 → 2p−1 radiative transitions in coincidence with the 2s photoelectron emission in Ne. In NO, the observed coincidence events are attributed to dissociative photoionization with excitation, whereby photoelectron emission is followed by fragmentation of excited NO+ ions into O+ + N* or N+ + O* and VUV emission from an excited neutral fragment. The highest coincidence rate occurs with the opening of ionization channels which are due to correlation satellites of the 3σ photoionization. The decay time of VUV photon emission was also measured, implying that specific excited states of N atoms contribute significantly to observed VUV emission.

More information

Item ID: 6974
DC Identifier: https://oa.upm.es/6974/
OAI Identifier: oai:oa.upm.es:6974
DOI: 10.1016/j.elspec.2010.07.003
Official URL: http://www.sciencedirect.com/science/journal/03682...
Deposited by: Memoria Investigacion
Deposited on: 20 May 2011 08:01
Last Modified: 20 Apr 2016 16:05
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