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Capacitance Measurements for Subcell Characterization in Multijunction Solar Cells.
Citation
Ruiz, C.M. and Rey-Stolle Prado, Ignacio and García Vara, Iván and Barrigón Montañés, Enrique and Espinet González, Pilar and Bermudez, V. and Algora del Valle, Carlos (2010). Capacitance Measurements for Subcell Characterization in Multijunction Solar Cells.. In: "35th IEEE Photovoltaic Specialists Conference, PVSC 2010", 20/06/2010 - 25/06/2010, Honolulu, Hawaii, EEUU. ISBN 978-1-4244-5890-5.
Description
| Title: | Capacitance Measurements for Subcell Characterization in Multijunction Solar Cells. |
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| Author/s: |
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| Item Type: | Presentation at Congress or Conference (Article) |
| Event Title: | 35th IEEE Photovoltaic Specialists Conference, PVSC 2010 |
| Event Dates: | 20/06/2010 - 25/06/2010 |
| Event Location: | Honolulu, Hawaii, EEUU |
| Title of Book: | Proceedings of the 35th IEEE Photovoltaic Specialists Conference, PVSC 2010 |
| Date: | 2010 |
| ISBN: | 978-1-4244-5890-5 |
| Subjects: | |
| Faculty: | E.T.S.I. Telecomunicación (UPM) |
| Department: | Electrónica Física |
| Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
Abstract
On this paper we present an alternative way to analyze de electronic properties of each subcell from the complete device. By illuminating the cell with light sources which energy is near one of the subcell bandgaps, it is possible to “erase” the presence of such subcell on the CV curve. The main advantages of this technique are that it is not destructive, it can be measured on the complete cell so can be easily implemented as a diagnostic technique for controlling electronic deviations.
More information
| Item ID: | 8221 |
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| DC Identifier: | https://oa.upm.es/8221/ |
| OAI Identifier: | oai:oa.upm.es:8221 |
| Official URL: | http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5617045 |
| Deposited by: | Memoria Investigacion |
| Deposited on: | 03 Aug 2011 11:55 |
| Last Modified: | 20 Apr 2016 17:05 |
