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González Ciprián, José Ramón and Vázquez López, Manuel and Nuñez Mendoza, Neftali and Algora del Valle, Carlos and Espinet González, Pilar (2010). Reliability Improvement in III-V Concentrator Solar Cells by Means of Perimeter Protection. In: "6th International Conference on Concentrating Photovoltaic Systems", 07/04/2010 - 09/04/2010, Friburgo, Alemania. ISBN 9780735408272.
Title: | Reliability Improvement in III-V Concentrator Solar Cells by Means of Perimeter Protection |
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Author/s: |
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Item Type: | Presentation at Congress or Conference (Article) |
Event Title: | 6th International Conference on Concentrating Photovoltaic Systems |
Event Dates: | 07/04/2010 - 09/04/2010 |
Event Location: | Friburgo, Alemania |
Title of Book: | Proceedings of the 6th International Conference on Concentrating Photovoltaic Systems |
Date: | 2010 |
ISBN: | 9780735408272 |
Subjects: | |
Freetext Keywords: | Reliability, Degradation, Qualification |
Faculty: | E.T.S.I. Telecomunicación (UPM) |
Department: | Electrónica Física |
Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
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This paper presents the evolution in the strategy to assess the reliability of III-V solar cells and a new thermal ageing test carried out over GaAs single junction solar cells at three different temperatures (130, 150 and 170° C). The perimeter of the solar cells has been protected with silicone, which seems to be an effective way of enhancing the reliability of the solar cells. A preliminary analysis of the results indicates a mean time to failure (MTTF) one order of magnitude larger than the one obtained in a previous thermal test with the perimeter uncoated.
Item ID: | 8251 |
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DC Identifier: | https://oa.upm.es/8251/ |
OAI Identifier: | oai:oa.upm.es:8251 |
Official URL: | http://www.cpv-6.org/cms/ |
Deposited by: | Memoria Investigacion |
Deposited on: | 01 Aug 2011 09:29 |
Last Modified: | 20 Apr 2016 17:06 |