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Tablero Crespo, César ORCID: https://orcid.org/0000-0001-9721-1549
(2010).
Acceptor and donor ionization energy levels in O-doped ZnTe.
"Computational Materials Science", v. 49
(n. 2);
pp. 368-371.
ISSN 0927-0256.
https://doi.org/10.1016/j.commatsci.2010.05.023.
Title: | Acceptor and donor ionization energy levels in O-doped ZnTe |
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Author/s: |
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Item Type: | Article |
Título de Revista/Publicación: | Computational Materials Science |
Date: | August 2010 |
ISSN: | 0927-0256 |
Volume: | 49 |
Subjects: | |
Freetext Keywords: | Ionization levels; ZnTe:O; Intermediate band; Photovoltaics |
Faculty: | E.T.S.I. Telecomunicación (UPM) |
Department: | Electrónica Física |
Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
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The O-doped ZnTe (ZnTe1−xOx) alloys present induce levels through O doping into the host semiconductor gap. ZnTe usually crystallizes in the zinc-blend structure and ZnO in the wurtzite structure under normal conditions. Therefore two possible ZnTe1−xOx phases may coexist, although in different proportions, depending on experimental growth conditions. We present total energy calculations and analyze some of their electronic properties with respect to: the two ordered wurtzite and zinc-blende structures, the concentration (x from 0.0078 to 0.5), the localized basis set (from single-zeta to quadruple-zeta with polarization basis sets), and the variation of the ionization levels with x and with the distance O–Zn.
Item ID: | 8355 |
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DC Identifier: | https://oa.upm.es/8355/ |
OAI Identifier: | oai:oa.upm.es:8355 |
DOI: | 10.1016/j.commatsci.2010.05.023 |
Official URL: | http://www.sciencedirect.com |
Deposited by: | Memoria Investigacion |
Deposited on: | 14 Jul 2011 10:54 |
Last Modified: | 31 Oct 2014 12:19 |