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Algora del Valle, Carlos (2010). Reliability of III-V concentrator solar cells. In: "21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis", 11/10/2010 - 15/10/2010, Gaeta, Italia.
Title: | Reliability of III-V concentrator solar cells |
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Author/s: |
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Item Type: | Presentation at Congress or Conference (Unspecified) |
Event Title: | 21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis |
Event Dates: | 11/10/2010 - 15/10/2010 |
Event Location: | Gaeta, Italia |
Title of Book: | Microelectronics Reliability. Proceedings of the 21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis |
Date: | September 2010 |
Volume: | 50, Is |
Subjects: | |
Faculty: | E.T.S.I. Telecomunicación (UPM) |
Department: | Electrónica Física |
Creative Commons Licenses: | Recognition - No derivative works - Non commercial |
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III–V concentrator solar cells are starting to be commercialized. However, no complete studies about their reliability have been carried out. A review about both the accelerated ageing tests and real time tests developed till now is presented. A proposal about the required tests is also done. In this stage, the tests show that III–V concentrator cells are robust devices with MTTFs well over the expected ones (30 years).
Item ID: | 8389 |
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DC Identifier: | https://oa.upm.es/8389/ |
OAI Identifier: | oai:oa.upm.es:8389 |
Official URL: | http://www.sciencedirect.com/science/journal/00262714 |
Deposited by: | Memoria Investigacion |
Deposited on: | 26 Aug 2011 08:52 |
Last Modified: | 20 Apr 2016 17:12 |