Export: Self-validating technique for the measurement of the linewidth enhancement factor in semiconductor lasers
Consoli Barone, Antonio (2011). Self-validating technique for the measurement of the linewidth enhancement factor in semiconductor lasers. "Optics Express", v. 20 (n. 5); pp. 4979-4987. ISSN 1094-4087. https://doi.org/10.1364/OE.20.004979.
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