Export: Aluminium incorporation in AlGaN/GaN heterostructures: a comparative study by ion beam analysis and X-ray diffraction
Redondo-Cubero, Andrés, Gago, R., González-Posada Flores, Fernando, Kreissig, U., Di Forte Poisson, M-A., Braña, A.F. and Muñoz Merino, Elias 
ORCID: https://orcid.org/0000-0001-7482-2590
(2008).
Aluminium incorporation in AlGaN/GaN heterostructures: a comparative study by ion beam analysis and X-ray diffraction.
"Thin Solid Films", v. 516
(n. 23);
pp. 8447-8452.
ISSN 0040-6090.
https://doi.org/10.1016/j.tsf.2008.04.069.
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