Export: Ratio-based temperature-sensing technique hardened against nanometer process variations
Ituero Herrero, Pablo 
ORCID: https://orcid.org/0000-0001-6448-7936 and López Vallejo, Marisa ORCID: https://orcid.org/0000-0002-3833-524X
(2013).
Ratio-based temperature-sensing technique hardened against nanometer process variations.
"IEEE Sensors Journal", v. 13
(n. 2);
pp. 442-443.
ISSN 1530-437X.
https://doi.org/10.1109/JSEN.2012.2227713.
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