Export: Semiconductor parameter extraction via current-voltage characterization and Bayesian inference methods
Kurchin, Rachel C., Poindexter, Jeremy R., Kitchaev, Daniil, Vähänissi, Ville, Cañizo Nadal, Carlos del 
ORCID: https://orcid.org/0000-0003-1287-6854, Zhe, Liu, Laine, Hannu S., Roat, Chris, Levcenco, S., Ceder, Gerbrand and Buonassisi, Tonio
(2018).
Semiconductor parameter extraction via current-voltage characterization and Bayesian inference methods.
In: "Proceedings of IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC)", 10/06/2018 - 15/06/2018, Waikoloa (USA). ISBN 978-1-5386-8529-7. pp. 3271-3275.
https://doi.org/10.1109/PVSC.2018.8547288.
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