Export: Exact Outage Probability Caused by Multiple Nakagami Interferers with Arbitrary Parameters
Liu, Qiuyan, Zhong, Zhangdui, Ai, Bo, Wang, Miao and Briso Rodriguez, Cesar 
ORCID: https://orcid.org/0000-0001-8219-9110
(2010).
Exact Outage Probability Caused by Multiple Nakagami Interferers with Arbitrary Parameters.
In: "IEEE 72nd Vehicular Technology Conference, VTC2010-Fall", 06/09/2010 - 09/09/2010, Ottawa, Canad. ISBN 978-1-4244-3573-9.
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