Export: Degradation of AlInGap red LEDs under drive current and temperature accelerated life tests
Vázquez López, Manuel and Nuñez Mendoza, Neftali and Nogueira Díaz, Eduardo and Borreguero, A. (2010). Degradation of AlInGap red LEDs under drive current and temperature accelerated life tests. In: "21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis", 11/10/2010 - 15/10/2010, Gaeta, Italia.
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