TY  - CONF
PB  - IEEE, Institute of Electrical and Electronics Engineers
ID  - upm12528
N2  - This paper presents some of the results of a method to determine the main reliability functions of concentrator solar cells. High concentrator GaAs single junction solar cells have been tested in an Accelerated Life Test. The method can be directly applied to multi-junction solar cells. The main conclusions of this test carried out show that these solar cells are robust devices with a very low probability of failure caused by degradation during their operation life (more than 30 years). The evaluation of the probability operation function (i.e. the reliability function R(t)) is obtained for two nominal operation conditions of these cells, namely simulated concentration ratios of 700 and 1050 suns. Preliminary determination of the Mean Time to Failure indicates a value much higher than the intended operation life time of the concentrator cells.
TI  - Statistical Calculation of the Main Reliability Functions of GaAs Concentrator III-V Solar Cells
M2  - Seattle, EEUU
SP  - 2533
AV  - public
A1  - Nuñez Mendoza, Neftali
A1  - González Ciprián, José Ramón
A1  - Vázquez López, Manuel
A1  - Espinet González, Pilar
A1  - Algora del Valle, Carlos
SN  - 978-1-4244-9966-3
Y1  - 2011///
UR  - http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6186462&tag=1
EP  - 2536
CY  - New York, EEUU
T2  - 37th IEEE Photovoltaic Specialists Conference
ER  -