TY  - CONF
PB  - Braunschweig
TI  - Aluminium Nitride Solidly Mounted BAW Resonators with Iridium Electrodes
CY  - Alemania
Y1  - 2008/04/22/
A1  - Clement Lorenzo, Marta
A1  - Olivares Roza, Jimena
A1  - Iborra Grau, Enrique
A1  - González Castilla, Sheila
A1  - Sangrador García, Jesús
A1  - Rimmer, Nick
A1  - Rastogi, A.
A1  - Ivira, B.
A1  - Reinhardt, Alexandre
ID  - upm3928
T2  - 22nd European Frequency and Time Forum (EFTF) 2008
AV  - public
UR  - http://www.eftf.org/proceedings/PDFs/FPE-0159.pdf
M2  - Toulouse, Francia
N2  - In this work we investigated the performance of aluminium nitride (AlN)-based solidly mounted resonators (SMR) made with iridium (Ir) bottom electrodes. Ir/AlN/metal stacks were grown on top of insulating Bragg mirrors composed of alternate ?/4 layers of silicon oxi-carbide (SiOC) and silicon nitride (Si3N4).Ir electrodes of various thicknesses were electron-beam evaporated on different adhesion layers, which also acted as seed layers. AlN was deposited by sputtering after conditioning the Ir electrode by a soft-etch with Ar+ ions, which was essential to achieve high quality AlN films. The structure and morphology of the different layers were analysed by x-ray diffraction (XRD) and atomic force microscopy (AFM). The frequency response of the SMRs was assessed by measuring the input scattering parameterS11 with a network analyzer. The experimental results were fitted to the Butterworth-Van Dyke circuital model. The effective electromechanical coupling factor k2eff, and the quality factor Q of the resonators were derived from the experimental data. The influence of the thickness, crystal quality and roughness of the Ir bottom electrodes on the performance of the resonators was investigated.
ER  -