?url_ver=Z39.88-2004&rft_id=10.1103%2FPhysRevB.82.165201&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.aulast=S%C3%A1nchez+Noriega&rft.aufirst=Kefr%C3%A9n&rft.au=S%C3%A1nchez+Noriega%2C+Kefr%C3%A9n&rft.volume=82&rft.issue=16&rft.pages=165201-1&rft.issn=1098-0121&rft.date=October+2010&rft.atitle=Formation+of+a+reliable+intermediate+band+in+Si+heavily+coimplanted+with+chalcogens+(S%2C+Se%2C+Te)+and+group+III+elements+(B%2C+Al)&rft.title=Physical+Review+B&rft.genre=article