eprintid: 8406
rev_number: 21
eprint_status: archive
userid: 1903
dir: disk0/00/00/84/06
datestamp: 2011-08-25 08:41:51
lastmod: 2014-09-26 17:21:25
status_changed: 2011-08-25 08:41:51
type: conference_item
metadata_visibility: show
item_issues_count: 0
creators_name: Nuñez Mendoza, Neftali
creators_name: Vázquez López, Manuel
creators_name: González Ciprián, José Ramón
creators_name: Algora del Valle, Carlos
creators_name: Espinet González, Pilar
title: Novel accelerated testing method for III-V concentrator solar cells
ispublished: pub
subjects: telecomunicaciones
subjects: fisica
abstract: Accelerated testing is a necessary tool in order to demonstrate the reliability of concentration photovoltaic solar cells, devices which is expected to be working not less than 25 years. Many problems arise when implementing high temperature accelerated testing in this kind of solar cells, because the high light irradiation level, at which they work, is very difficult to achieve inside a climatic chamber. This paper presents a novel accelerated testing method for concentrator solar cells, under simulated electrical working conditions (i.e. forward biasing the solar cells at the equivalent current they would handle at 700 suns), that overcomes some of the limitations found in test these devices inside the chamber. The tracked power of the solar cells to 700×, experiences a degradation of 1.69% after 4232 h, in the 130 °C test, and of 2.20% after 2000 h in the 150 °C one. An additional test has been carried out at 150 °C, increasing the current to that equivalent to 1050 suns. This last test shows a power degradation of 4% for the same time.
date: 2010-09
date_type: published
publisher: Elsevier
official_url: http://www.sciencedirect.com/science/journal/00262714
full_text_status: public
pres_type: paper
volume: 50, Is
place_of_pub: Amsterdam, Paises Bajos
event_title: 21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
event_location: Gaeta, Italia
event_dates: 11/10/2010 - 15/10/2010
event_type: conference
institution: Telecomunicacion
department: Electronica2
refereed: TRUE
book_title: Microelectronics Reliability. Proceedings of the 21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
rights: by-nc-nd
citation:   Nuñez Mendoza, Neftali and Vázquez López, Manuel and González Ciprián, José Ramón and Algora del Valle, Carlos and Espinet González, Pilar  (2010).  Novel accelerated testing method for III-V concentrator solar cells.  In: "21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis", 11/10/2010 - 15/10/2010, Gaeta, Italia.    
document_url: https://oa.upm.es/8406/2/INVE_MEM_2010_82229.pdf