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ORCID: https://orcid.org/0000-0002-1281-2538, García Rosillo, Félix
ORCID: https://orcid.org/0000-0002-2728-546X, Muñoz García, Miguel Angel
ORCID: https://orcid.org/0000-0002-3670-8989 and Alonso García, María del Carmen
ORCID: https://orcid.org/0000-0002-4457-3551
(2024).
Enhancing photovoltaic module sustainability: Defect analysis on partially repaired modules from Spanish PV plants.
"Journal of Cleaner Production", v. 461
;
p. 142575.
ISSN 0959-6526.
https://doi.org/https://doi.org/10.1016/j.jclepro.2024.142575.
| Título: | Enhancing photovoltaic module sustainability: Defect analysis on partially repaired modules from Spanish PV plants |
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| Autor/es: |
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| Tipo de Documento: | Artículo |
| Título de Revista/Publicación: | Journal of Cleaner Production |
| Fecha: | Julio 2024 |
| ISSN: | 0959-6526 |
| Volumen: | 461 |
| Materias: | |
| Escuela: | E.T.S. de Ingeniería Agronómica, Alimentaria y de Biosistemas (UPM) |
| Departamento: | Ingeniería Agroforestal |
| Grupo Investigación UPM: | Técnicas Avanzadas en Agroalimentación LPF-TAGRALIA |
| Licencias Creative Commons: | Reconocimiento - Sin obra derivada - No comercial |
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Between 2010 and 2022, there has been a significant increase in photovoltaic (PV) solar energy installations, driven by factors such as cost reductions, technological advances, policy support and innovative financing approaches. However, this rapid growth has created a significant challenge in the form of increased PV waste generation, coinciding with global commitments to achieve carbon neutrality by 2050. The potential for reuse of decommissioned PV modules represents an environmentally sustainable way forward that requires a comprehensive assessment of technical, economic, environmental and regulatory considerations. This study focuses on evaluating the impact of defects in partially repaired PV modules from Spanish installations on their power output and efficiency, with the aim of developing strategies to increase reuse and reduce environmental impact. The research focuses on 23 crystalline silicon modules and uses established techniques to evaluate their operational condition, detect defects and assess potential safety risks. Among the defects observed, moisture-induced degradation (MID) emerges as the most prevalent, followed by cracked cells and disconnected areas in cells across different technologies. Notably, despite the presence of defects, approximately 87 of these modules have a power loss of less than 20 .
| ID de Registro: | 86350 |
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| Identificador DC: | https://oa.upm.es/86350/ |
| Identificador OAI: | oai:oa.upm.es:86350 |
| URL Portal Científico: | https://portalcientifico.upm.es/es/ipublic/item/10226266 |
| Identificador DOI: | https://doi.org/10.1016/j.jclepro.2024.142575 |
| URL Oficial: | https://www.sciencedirect.com/science/article/pii/... |
| Depositado por: | Prof. Dr. Miguel Angel /M.A. Muñoz-García |
| Depositado el: | 20 Ene 2025 11:54 |
| Ultima Modificación: | 20 Ene 2025 15:14 |
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