OOPS! – OntOlogy Pitfalls Scanner!

Poveda Villalón, María ORCID: https://orcid.org/0000-0003-3587-0367 and Suárez-Figueroa, Mari Carmen (2012). OOPS! – OntOlogy Pitfalls Scanner!. Monografía (Informe Técnico). Facultad de Informática (UPM) [antigua denominación], Madrid.

Descripción

Título: OOPS! – OntOlogy Pitfalls Scanner!
Autor/es:
  • Poveda Villalón, María https://orcid.org/0000-0003-3587-0367
  • Suárez-Figueroa, Mari Carmen
Tipo de Documento: Monográfico (Informe Técnico)
Fecha: 31 Enero 2012
Materias:
ODS:
Palabras Clave Informales: oeg, pitfalls, worst practices, ontology evaluation, ontology engineering
Escuela: Facultad de Informática (UPM) [antigua denominación]
Departamento: Inteligencia Artificial
Grupo Investigación UPM: Ontology Engineering Group – OEG
Licencias Creative Commons: Reconocimiento - No comercial - Compartir igual

Texto completo

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Resumen

The application of methodologies for building ontologies has improved the ontology quality. However, such a quality is not totally guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or worst practices in the modelling. Several authors have provided lists of typical anomalies detected in ontologies during the last decade. In this context, our aim in this technical report is to describe OOPS! (OntOlogy Pitfalls Scanner!), a tool for pitfalls detection in ontology developments.

Más información

ID de Registro: 10195
Identificador DC: https://oa.upm.es/10195/
Identificador OAI: oai:oa.upm.es:10195
Depositado por: Estudiante María Poveda Villalón
Depositado el: 01 Feb 2012 08:48
Ultima Modificación: 22 May 2024 06:59