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ORCID: https://orcid.org/0000-0003-3587-0367 and Suárez-Figueroa, Mari Carmen
(2012).
OOPS! – OntOlogy Pitfalls Scanner!.
Monografía (Informe Técnico).
Facultad de Informática (UPM) [antigua denominación], Madrid.
| Título: | OOPS! – OntOlogy Pitfalls Scanner! |
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| Autor/es: |
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| Tipo de Documento: | Monográfico (Informe Técnico) |
| Fecha: | 31 Enero 2012 |
| Materias: | |
| ODS: | |
| Palabras Clave Informales: | oeg, pitfalls, worst practices, ontology evaluation, ontology engineering |
| Escuela: | Facultad de Informática (UPM) [antigua denominación] |
| Departamento: | Inteligencia Artificial |
| Grupo Investigación UPM: | Ontology Engineering Group – OEG |
| Licencias Creative Commons: | Reconocimiento - No comercial - Compartir igual |
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The application of methodologies for building ontologies has improved the ontology quality. However, such a quality is not totally guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or worst practices in the modelling. Several authors have provided lists of typical anomalies detected in ontologies during the last decade. In this context, our aim in this technical report is to describe OOPS! (OntOlogy Pitfalls Scanner!), a tool for pitfalls detection in ontology developments.
| ID de Registro: | 10195 |
|---|---|
| Identificador DC: | https://oa.upm.es/10195/ |
| Identificador OAI: | oai:oa.upm.es:10195 |
| Depositado por: | Estudiante María Poveda Villalón |
| Depositado el: | 01 Feb 2012 08:48 |
| Ultima Modificación: | 22 May 2024 06:59 |
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