OOPS! – OntOlogy Pitfalls Scanner!

Poveda Villalon, Maria and Suárez-Figueroa, Mari Carmen (2012). OOPS! – OntOlogy Pitfalls Scanner!. Monografía (Technical Report). Facultad de Informática (UPM), Madrid.

Description

Title: OOPS! – OntOlogy Pitfalls Scanner!
Author/s:
  • Poveda Villalon, Maria
  • Suárez-Figueroa, Mari Carmen
Item Type: Monograph (Technical Report)
Date: 31 January 2012
Subjects:
Freetext Keywords: oeg, pitfalls, worst practices, ontology evaluation, ontology engineering
Faculty: Facultad de Informática (UPM)
Department: Inteligencia Artificial
UPM's Research Group: Ontology Engineering Group – OEG
Creative Commons Licenses: Recognition - Non commercial - Share

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Abstract

The application of methodologies for building ontologies has improved the ontology quality. However, such a quality is not totally guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or worst practices in the modelling. Several authors have provided lists of typical anomalies detected in ontologies during the last decade. In this context, our aim in this technical report is to describe OOPS! (OntOlogy Pitfalls Scanner!), a tool for pitfalls detection in ontology developments.

More information

Item ID: 10195
DC Identifier: http://oa.upm.es/10195/
OAI Identifier: oai:oa.upm.es:10195
Deposited by: Estudiante María Poveda Villalón
Deposited on: 01 Feb 2012 08:48
Last Modified: 20 Apr 2016 18:26
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