Thickness dependence of critical temperature in Mo/Au bilayers

Parra Borderías, Maria and Fernández Martínez, Ivan and Fábrega, Lourdes and Camón, Agustin and Gil, Oscar and Costa Krämer, Jose L. and Gonzalez Arrabal, Raquel and Sesé, Javier and Briones Fernández-Pola, Fernando (2011). Thickness dependence of critical temperature in Mo/Au bilayers. In: "EUCAS 2011 exposición superconductividad aplicada", 18/09/2011 - 23/09/2011, The Hague, Holanda.

Description

Title: Thickness dependence of critical temperature in Mo/Au bilayers
Author/s:
  • Parra Borderías, Maria
  • Fernández Martínez, Ivan
  • Fábrega, Lourdes
  • Camón, Agustin
  • Gil, Oscar
  • Costa Krämer, Jose L.
  • Gonzalez Arrabal, Raquel
  • Sesé, Javier
  • Briones Fernández-Pola, Fernando
Item Type: Presentation at Congress or Conference (Poster)
Event Title: EUCAS 2011 exposición superconductividad aplicada
Event Dates: 18/09/2011 - 23/09/2011
Event Location: The Hague, Holanda
Title of Book: Proceedings of EUCAS 2011 exposición superconductividad aplicada
Date: 2011
Subjects:
Faculty: E.T.S.I. Industriales (UPM)
Department: Ingeniería Nuclear [hasta 2014]
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

We report on the sensitivity of the superconducting critical temperature (TC) to layer thickness, as well as on TC reproducibility in Mo/Au bilayers. Resistivity measurements on samples with a fixed Au thickness (dAu) and Mo thickness (dMo) ranging from 50 to 250 nm, and with a fixed dMo and different dAu thickness are shown. Experimental data are discussed in the framework of Martinis model, whose application to samples with dAu above their coherence length is analysed in detail. Results show a good coupling between normal and superconducting layers and excellent TC reproducibility, allowing to accurately correlate Mo layer thickness and bilayer TC.

More information

Item ID: 12495
DC Identifier: http://oa.upm.es/12495/
OAI Identifier: oai:oa.upm.es:12495
Deposited by: Memoria Investigacion
Deposited on: 08 Aug 2012 09:57
Last Modified: 21 Apr 2016 11:45
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