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Statistical Calculation of the Main Reliability Functions of GaAs Concentrator III-V Solar Cells
Cita
Núñez Mendoza, Neftalí 
ORCID: https://orcid.org/0000-0003-2339-2441, González Ciprián, José Ramón, Vázquez López, Manuel ORCID: https://orcid.org/0000-0003-1070-1751, Espinet González, Pilar and Algora del Valle, Carlos ORCID: https://orcid.org/0000-0003-1872-7243
(2011).
Statistical Calculation of the Main Reliability Functions of GaAs Concentrator III-V Solar Cells.
En: "37th IEEE Photovoltaic Specialists Conference", 19/06/2011 - 24/06/2011, Seattle, EEUU. ISBN 978-1-4244-9966-3. pp. 2533-2536.
ORCID: https://orcid.org/0000-0003-2339-2441, González Ciprián, José Ramón, Vázquez López, Manuel ORCID: https://orcid.org/0000-0003-1070-1751, Espinet González, Pilar and Algora del Valle, Carlos ORCID: https://orcid.org/0000-0003-1872-7243
(2011).
Statistical Calculation of the Main Reliability Functions of GaAs Concentrator III-V Solar Cells.
En: "37th IEEE Photovoltaic Specialists Conference", 19/06/2011 - 24/06/2011, Seattle, EEUU. ISBN 978-1-4244-9966-3. pp. 2533-2536.
Descripción
| Título: | Statistical Calculation of the Main Reliability Functions of GaAs Concentrator III-V Solar Cells |
|---|---|
| Autor/es: |
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| Tipo de Documento: | Ponencia en Congreso o Jornada (Artículo) |
| Título del Evento: | 37th IEEE Photovoltaic Specialists Conference |
| Fechas del Evento: | 19/06/2011 - 24/06/2011 |
| Lugar del Evento: | Seattle, EEUU |
| Título del Libro: | Proceedings of the 37th IEEE Photovoltaic Specialists Conference |
| Fecha: | 2011 |
| ISBN: | 978-1-4244-9966-3 |
| Materias: | |
| ODS: | |
| Escuela: | E.U.I.T. Telecomunicación (UPM) [antigua denominación] |
| Departamento: | Electrónica Física |
| Licencias Creative Commons: | Reconocimiento - Sin obra derivada - No comercial |
Resumen
This paper presents some of the results of a method to determine the main reliability functions of concentrator solar cells. High concentrator GaAs single junction solar cells have been tested in an Accelerated Life Test. The method can be directly applied to multi-junction solar cells. The main conclusions of this test carried out show that these solar cells are robust devices with a very low probability of failure caused by degradation during their operation life (more than 30 years). The evaluation of the probability operation function (i.e. the reliability function R(t)) is obtained for two nominal operation conditions of these cells, namely simulated concentration ratios of 700 and 1050 suns. Preliminary determination of the Mean Time to Failure indicates a value much higher than the intended operation life time of the concentrator cells.
Más información
| ID de Registro: | 12528 |
|---|---|
| Identificador DC: | https://oa.upm.es/12528/ |
| Identificador OAI: | oai:oa.upm.es:12528 |
| URL Oficial: | http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumb... |
| Depositado por: | Memoria Investigacion |
| Depositado el: | 07 Ago 2012 08:08 |
| Ultima Modificación: | 05 Mar 2024 15:13 |
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