Did you validate your ontology? OOPS!

Poveda Villalón, María ORCID: https://orcid.org/0000-0003-3587-0367, Suárez-Figueroa, Mari Carmen ORCID: https://orcid.org/0000-0003-3807-5019 and Gómez-Pérez, A. ORCID: https://orcid.org/0000-0002-3037-0331 (2012). Did you validate your ontology? OOPS!. En: "9ª Extended Semantic Web Conference (ESWC2012)", 27 - 31 May, 2012, Heraklion, Grecia.

Descripción

Título: Did you validate your ontology? OOPS!
Autor/es:
Tipo de Documento: Ponencia en Congreso o Jornada (Póster)
Título del Evento: 9ª Extended Semantic Web Conference (ESWC2012)
Fechas del Evento: 27 - 31 May, 2012
Lugar del Evento: Heraklion, Grecia
Título del Libro: 9ª Extended Semantic Web Conference (ESWC2012)
Fecha: Mayo 2012
Materias:
ODS:
Palabras Clave Informales: pitfalls, bad practices, ontology evaluation, ontology engineering
Escuela: Facultad de Informática (UPM) [antigua denominación]
Departamento: Inteligencia Artificial
Grupo Investigación UPM: oeg
Licencias Creative Commons: Ninguna

Texto completo

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Resumen

The application of methodologies for building ontologies can im-prove ontology quality. However, such quality is not guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or bad practices within the ontology development. Sev-eral authors have provided lists of typical anomalies detected in ontologies dur-ing the last decade. In this context, our aim in this paper is to describe OOPS! (OntOlogy Pitfall Scanner!), a tool for detecting pitfalls in ontologies.

Más información

ID de Registro: 14478
Identificador DC: https://oa.upm.es/14478/
Identificador OAI: oai:oa.upm.es:14478
Depositado por: Dr Oscar Corcho
Depositado el: 13 Feb 2013 12:12
Ultima Modificación: 22 May 2024 06:59