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ORCID: https://orcid.org/0000-0003-3587-0367, Suárez-Figueroa, Mari Carmen
ORCID: https://orcid.org/0000-0003-3807-5019 and Gómez-Pérez, A.
ORCID: https://orcid.org/0000-0002-3037-0331
(2012).
Did you validate your ontology? OOPS!.
En: "9ª Extended Semantic Web Conference (ESWC2012)", 27 - 31 May, 2012, Heraklion, Grecia.
| Título: | Did you validate your ontology? OOPS! |
|---|---|
| Autor/es: |
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| Tipo de Documento: | Ponencia en Congreso o Jornada (Póster) |
| Título del Evento: | 9ª Extended Semantic Web Conference (ESWC2012) |
| Fechas del Evento: | 27 - 31 May, 2012 |
| Lugar del Evento: | Heraklion, Grecia |
| Título del Libro: | 9ª Extended Semantic Web Conference (ESWC2012) |
| Fecha: | Mayo 2012 |
| Materias: | |
| ODS: | |
| Palabras Clave Informales: | pitfalls, bad practices, ontology evaluation, ontology engineering |
| Escuela: | Facultad de Informática (UPM) [antigua denominación] |
| Departamento: | Inteligencia Artificial |
| Grupo Investigación UPM: | oeg |
| Licencias Creative Commons: | Ninguna |
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The application of methodologies for building ontologies can im-prove ontology quality. However, such quality is not guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or bad practices within the ontology development. Sev-eral authors have provided lists of typical anomalies detected in ontologies dur-ing the last decade. In this context, our aim in this paper is to describe OOPS! (OntOlogy Pitfall Scanner!), a tool for detecting pitfalls in ontologies.
| ID de Registro: | 14478 |
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| Identificador DC: | https://oa.upm.es/14478/ |
| Identificador OAI: | oai:oa.upm.es:14478 |
| Depositado por: | Dr Oscar Corcho |
| Depositado el: | 13 Feb 2013 12:12 |
| Ultima Modificación: | 22 May 2024 06:59 |
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