Did you validate your ontology? OOPS!

Poveda-Villalón, María and Suárez-Figueroa, Mari Carmen and Gómez-Pérez, A. (2012). Did you validate your ontology? OOPS!. In: "9ª Extended Semantic Web Conference (ESWC2012)", 27 - 31 May, 2012, Heraklion, Grecia.

Description

Title: Did you validate your ontology? OOPS!
Author/s:
  • Poveda-Villalón, María
  • Suárez-Figueroa, Mari Carmen
  • Gómez-Pérez, A.
Item Type: Presentation at Congress or Conference (Poster)
Event Title: 9ª Extended Semantic Web Conference (ESWC2012)
Event Dates: 27 - 31 May, 2012
Event Location: Heraklion, Grecia
Title of Book: 9ª Extended Semantic Web Conference (ESWC2012)
Date: May 2012
Subjects:
Freetext Keywords: pitfalls, bad practices, ontology evaluation, ontology engineering
Faculty: Facultad de Informática (UPM)
Department: Inteligencia Artificial
UPM's Research Group: oeg
Creative Commons Licenses: None

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Abstract

The application of methodologies for building ontologies can im-prove ontology quality. However, such quality is not guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or bad practices within the ontology development. Sev-eral authors have provided lists of typical anomalies detected in ontologies dur-ing the last decade. In this context, our aim in this paper is to describe OOPS! (OntOlogy Pitfall Scanner!), a tool for detecting pitfalls in ontologies.

More information

Item ID: 14478
DC Identifier: http://oa.upm.es/14478/
OAI Identifier: oai:oa.upm.es:14478
Deposited by: Dr Oscar Corcho
Deposited on: 13 Feb 2013 12:12
Last Modified: 27 Oct 2015 07:41
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