Influence of Crystal Quality on the Excitation and Propagation of Surface and Bulk Acoustic Waves in Polycrystalline AlN Films

Clement Lorenzo, Marta ORCID: https://orcid.org/0000-0003-4956-8206, Olivares Roza, Jimena ORCID: https://orcid.org/0000-0003-4396-4363, Capilla Osorio, José, Sangrador García, Jesús ORCID: https://orcid.org/0000-0001-9582-8692 and Iborra Grau, Enrique ORCID: https://orcid.org/0000-0002-1385-1379 (2012). Influence of Crystal Quality on the Excitation and Propagation of Surface and Bulk Acoustic Waves in Polycrystalline AlN Films. "IEEE Transactions on Ultrasonics Ferroelectrics and Frequency", v. 59 (n. 1); pp. 128-134. ISSN 0885-3010. https://doi.org/10.1109/TUFFC.2012.2163.

Descripción

Título: Influence of Crystal Quality on the Excitation and Propagation of Surface and Bulk Acoustic Waves in Polycrystalline AlN Films
Autor/es:
Tipo de Documento: Artículo
Título de Revista/Publicación: IEEE Transactions on Ultrasonics Ferroelectrics and Frequency
Fecha: Enero 2012
ISSN: 0885-3010
Volumen: 59
Número: 1
Materias:
ODS:
Escuela: E.T.S.I. Telecomunicación (UPM)
Departamento: Tecnología Electrónica [hasta 2014]
Licencias Creative Commons: Reconocimiento - Sin obra derivada - No comercial

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Resumen

We investigate the excitation and propagation of acoustic waves in polycrystalline aluminum nitride films along the directions parallel and normal to the c-axis. Longitudinal and transverse propagations are assessed through the frequency response of surface acoustic wave and bulk acoustic wave devices fabricated on films of different crystal qualities. The crystalline properties significantly affect the electromechanical coupling factors and acoustic properties of the piezoelectric layers. The presence of misoriented grains produces an overall decrease of the piezoelectric activity, degrading more severely the excitation and propagation of waves traveling transversally to the c-axis. It is suggested that the presence of such crystalline defects in c-axis-oriented films reduces the mechanical coherence between grains and hinders the transverse deformation of the film when the electric field is applied parallel to the surface.

Más información

ID de Registro: 15687
Identificador DC: https://oa.upm.es/15687/
Identificador OAI: oai:oa.upm.es:15687
URL Portal Científico: https://portalcientifico.upm.es/es/ipublic/item/5486856
Identificador DOI: 10.1109/TUFFC.2012.2163
URL Oficial: http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumbe...
Depositado por: Memoria Investigacion
Depositado el: 17 Jun 2013 16:58
Ultima Modificación: 12 Nov 2025 00:00