Damage localization and failure locus under biaxial loading in glass-fiber nonwoven felts

Ridruejo Rodríguez, Álvaro ORCID: https://orcid.org/0000-0002-8327-6090, González Martínez, Carlos Daniel ORCID: https://orcid.org/0000-0002-0724-138X and Llorca Martinez, Francisco Javier ORCID: https://orcid.org/0000-0002-3122-7879 (2012). Damage localization and failure locus under biaxial loading in glass-fiber nonwoven felts. "International Journal for Multiscale Computational Engineering", v. 10 (n. 5); pp. 425-440. ISSN 1543-1649.

Descripción

Título: Damage localization and failure locus under biaxial loading in glass-fiber nonwoven felts
Autor/es:
Tipo de Documento: Artículo
Título de Revista/Publicación: International Journal for Multiscale Computational Engineering
Fecha: 2012
ISSN: 1543-1649
Volumen: 10
Número: 5
Materias:
ODS:
Palabras Clave Informales: Computational mechanics, nonwoven fabrics, damage, fracture localization, failure locus.
Escuela: E.T.S.I. Caminos, Canales y Puertos (UPM)
Departamento: Ciencia de los Materiales
Licencias Creative Commons: Reconocimiento - Sin obra derivada - No comercial

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Resumen

The pattern of damage localization and fracture under uniaxial and biaxial tension was studied in glass–fiber nonwoven felts. The analyses were carried out within the framework of the finite-element simulation of plain and notched specimens in which the microstructure of the felt, made up of fiber bundles connected at the cross point through an organic binder, was explicitly represented. Following previous experimental observations, fracture by interbundle decohesion and energy dissipation by frictional sliding between the bundles were included in the model. It was found that the failure path in these materials was controlled by the maximum applied normal stress, regardless of the loading path, and that the failure locus under biaxial tension was well represented by the von Mises failure criteria. The notch sensitivity of the nonwoven felts was limited and the presence of a notch did not modify the failure path.

Más información

ID de Registro: 15920
Identificador DC: https://oa.upm.es/15920/
Identificador OAI: oai:oa.upm.es:15920
Depositado por: Memoria Investigacion
Depositado el: 14 Ene 2014 16:30
Ultima Modificación: 11 Oct 2024 07:12