Mechanical Characterization of Multicrystalline Silicon Substrates for Solar Cell Applications

Tejado Garrido, Elena María and Orellana Pérez, T. and Pastor Caño, Jose Ignacio and Funke, V.C. and Fütterer, W. (2012). Mechanical Characterization of Multicrystalline Silicon Substrates for Solar Cell Applications. In: "XXIX Encuentro del Grupo Español de Fractura", 21 de marzo de 2012 a 23 de marzo de 2012, Bilbao (España).

Description

Title: Mechanical Characterization of Multicrystalline Silicon Substrates for Solar Cell Applications
Author/s:
  • Tejado Garrido, Elena María
  • Orellana Pérez, T.
  • Pastor Caño, Jose Ignacio
  • Funke, V.C.
  • Fütterer, W.
Item Type: Presentation at Congress or Conference (Article)
Event Title: XXIX Encuentro del Grupo Español de Fractura
Event Dates: 21 de marzo de 2012 a 23 de marzo de 2012
Event Location: Bilbao (España)
Title of Book: -
Date: 2012
Subjects:
Faculty: E.T.S.I. Caminos, Canales y Puertos (UPM)
Department: Ciencia de los Materiales
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

The possibility of using more economical silicon feedstock, i.e. as support for epitaxial solar cells, is of interest when the cost reduction and the properties are attractive. We have investigated the mechanical behaviour of two blocks of upgraded metallurgical silicon, which is known to present high content of impurities even after being purified by the directional solidification process. These impurities are mainly metals like Al and silicon compounds. Thus, it is important to characterize their effect in order to improve cell performance and to ensure the survival of the wafers throughout the solar value chain. Microstructure and mechanical properties were studied by means of ring on ring and three point bending tests. Additionally, elastic modulus and fracture toughness were measured. These results showed that it is possible to obtain marked improvements in toughness when impurities act as microscopic internal crack arrestors. However, the same impurities can be initiators of damage due to residual thermal stresses introduced during the crystallization process.

More information

Item ID: 16416
DC Identifier: http://oa.upm.es/16416/
OAI Identifier: oai:oa.upm.es:16416
Official URL: http://gef2012.mondragon.edu/es
Deposited by: Memoria Investigacion
Deposited on: 15 Jan 2014 16:33
Last Modified: 24 Sep 2018 07:46
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