In-situ optical reflectance characterization of ion beam irradiation damage on crystalline (quartz) and amorphous (silica) SiO2

Crespillo Almenara, Miguel and Peña Rodríguez, Ovidio Y. and Manzano Santamaría, Javier and Rivera de Mena, Antonio and Jimenez Rey, D. and Agullo Lopez, Fernando (2012). In-situ optical reflectance characterization of ion beam irradiation damage on crystalline (quartz) and amorphous (silica) SiO2. In: "18th International Conference on Ion Beam Modifications of Materials (IBMM 2012)", 02/09/2012 - 07/09/2012, Quingdao, China. pp. 1-32.

Description

Title: In-situ optical reflectance characterization of ion beam irradiation damage on crystalline (quartz) and amorphous (silica) SiO2
Author/s:
  • Crespillo Almenara, Miguel
  • Peña Rodríguez, Ovidio Y.
  • Manzano Santamaría, Javier
  • Rivera de Mena, Antonio
  • Jimenez Rey, D.
  • Agullo Lopez, Fernando
Item Type: Presentation at Congress or Conference (Speech)
Event Title: 18th International Conference on Ion Beam Modifications of Materials (IBMM 2012)
Event Dates: 02/09/2012 - 07/09/2012
Event Location: Quingdao, China
Title of Book: 18th International Conference on Ion Beam Modifications of Materials (IBMM 2012)
Date: 2012
Subjects:
Faculty: E.T.S.I. Industriales (UPM)
Department: Ingeniería Nuclear [hasta 2014]
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

Outline: • Motivation, aim • Complement waveguide data on silica • Optical data in quartz • Detailed analysis, i.e. both fluence kinetics and resolution • Efficiency of irradiation and analysis, samples, time... • Experimental set-up description • Reflectance procedure • Options: light source (lasers, white light..), detectors, configurations • Results and discussion • Comparative of amorphous and crystalline phases

More information

Item ID: 19680
DC Identifier: http://oa.upm.es/19680/
OAI Identifier: oai:oa.upm.es:19680
Deposited by: Memoria Investigacion
Deposited on: 08 Feb 2014 14:19
Last Modified: 30 May 2017 16:11
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