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In-situ optical reflectance characterization of ion beam irradiation damage on crystalline (quartz) and amorphous (silica) SiO2
Cita
Crespillo Almenara, Miguel, Peña Rodríguez, Ovidio Y., Manzano Santamaría, Javier, Rivera de Mena, Antonio Juan 
ORCID: https://orcid.org/0000-0002-8484-5099, Jimenez Rey, D. and Agulló López, Fernando
(2012).
In-situ optical reflectance characterization of ion beam irradiation damage on crystalline (quartz) and amorphous (silica) SiO2.
En: "18th International Conference on Ion Beam Modifications of Materials (IBMM 2012)", 02/09/2012 - 07/09/2012, Quingdao, China. pp. 1-32.
ORCID: https://orcid.org/0000-0002-8484-5099, Jimenez Rey, D. and Agulló López, Fernando
(2012).
In-situ optical reflectance characterization of ion beam irradiation damage on crystalline (quartz) and amorphous (silica) SiO2.
En: "18th International Conference on Ion Beam Modifications of Materials (IBMM 2012)", 02/09/2012 - 07/09/2012, Quingdao, China. pp. 1-32.
Descripción
| Título: | In-situ optical reflectance characterization of ion beam irradiation damage on crystalline (quartz) and amorphous (silica) SiO2 |
|---|---|
| Autor/es: |
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| Tipo de Documento: | Ponencia en Congreso o Jornada (Charla) |
| Título del Evento: | 18th International Conference on Ion Beam Modifications of Materials (IBMM 2012) |
| Fechas del Evento: | 02/09/2012 - 07/09/2012 |
| Lugar del Evento: | Quingdao, China |
| Título del Libro: | 18th International Conference on Ion Beam Modifications of Materials (IBMM 2012) |
| Fecha: | 2012 |
| Materias: | |
| ODS: | |
| Escuela: | E.T.S.I. Industriales (UPM) |
| Departamento: | Ingeniería Nuclear [hasta 2014] |
| Licencias Creative Commons: | Reconocimiento - Sin obra derivada - No comercial |
Resumen
Outline:
• Motivation, aim
• Complement waveguide data on silica
• Optical data in quartz
• Detailed analysis, i.e. both fluence kinetics and resolution
• Efficiency of irradiation and analysis, samples, time...
• Experimental set-up description
• Reflectance procedure
• Options: light source (lasers, white light..), detectors, configurations
• Results and discussion
• Comparative of amorphous and crystalline phases
Más información
| ID de Registro: | 19680 |
|---|---|
| Identificador DC: | https://oa.upm.es/19680/ |
| Identificador OAI: | oai:oa.upm.es:19680 |
| Depositado por: | Memoria Investigacion |
| Depositado el: | 08 Feb 2014 14:19 |
| Ultima Modificación: | 21 Jun 2024 06:06 |
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