Did you evaluate your ontology? OOPS! (OntOlogy Pitfall Scanner!)

Poveda Villalon, Maria and Suárez-Figueroa, Mari Carmen and Gómez-Pérez, A. (2012). Did you evaluate your ontology? OOPS! (OntOlogy Pitfall Scanner!). In: "18th International Conference, EKAW 2012", 08/10/2012 - 12/10/2012, Galway City, Ireland. pp..

Description

Title: Did you evaluate your ontology? OOPS! (OntOlogy Pitfall Scanner!)
Author/s:
  • Poveda Villalon, Maria
  • Suárez-Figueroa, Mari Carmen
  • Gómez-Pérez, A.
Item Type: Presentation at Congress or Conference (Poster)
Event Title: 18th International Conference, EKAW 2012
Event Dates: 08/10/2012 - 12/10/2012
Event Location: Galway City, Ireland
Title of Book: Proceedings 18th International Conference, EKAW 2012
Date: 2012
Subjects:
Faculty: Facultad de Informática (UPM)
Department: Inteligencia Artificial
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

The application of methodologies for building ontologies can improve ontology quality. However, such quality is not guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or bad practices within the ontology development. In this context, our aim is to describe OOPS!(OntOlogy Pitfall Scanner!), a tool for detecting pitfalls in ontologies.

More information

Item ID: 20287
DC Identifier: http://oa.upm.es/20287/
OAI Identifier: oai:oa.upm.es:20287
Deposited by: Memoria Investigacion
Deposited on: 23 Oct 2013 14:55
Last Modified: 27 Oct 2015 07:44
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