Did you evaluate your ontology? OOPS! (OntOlogy Pitfall Scanner!)

Poveda Villalón, María ORCID: https://orcid.org/0000-0003-3587-0367, Suárez-Figueroa, Mari Carmen ORCID: https://orcid.org/0000-0003-3807-5019 and Gómez-Pérez, A. ORCID: https://orcid.org/0000-0002-3037-0331 (2012). Did you evaluate your ontology? OOPS! (OntOlogy Pitfall Scanner!). En: "18th International Conference, EKAW 2012", 08/10/2012 - 12/10/2012, Galway City, Ireland. pp..

Descripción

Título: Did you evaluate your ontology? OOPS! (OntOlogy Pitfall Scanner!)
Autor/es:
Tipo de Documento: Ponencia en Congreso o Jornada (Póster)
Título del Evento: 18th International Conference, EKAW 2012
Fechas del Evento: 08/10/2012 - 12/10/2012
Lugar del Evento: Galway City, Ireland
Título del Libro: Proceedings 18th International Conference, EKAW 2012
Fecha: 2012
Materias:
ODS:
Escuela: Facultad de Informática (UPM) [antigua denominación]
Departamento: Inteligencia Artificial
Licencias Creative Commons: Reconocimiento - Sin obra derivada - No comercial

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Resumen

The application of methodologies for building ontologies can improve ontology quality. However, such quality is not guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or bad practices within the ontology development. In this context, our aim is to describe OOPS!(OntOlogy Pitfall Scanner!), a tool for detecting pitfalls in ontologies.

Más información

ID de Registro: 20287
Identificador DC: https://oa.upm.es/20287/
Identificador OAI: oai:oa.upm.es:20287
Depositado por: Memoria Investigacion
Depositado el: 23 Oct 2013 14:55
Ultima Modificación: 22 May 2024 06:59