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ORCID: https://orcid.org/0000-0003-3587-0367, Suárez-Figueroa, Mari Carmen
ORCID: https://orcid.org/0000-0003-3807-5019 and Gómez-Pérez, A.
ORCID: https://orcid.org/0000-0002-3037-0331
(2012).
Did you evaluate your ontology? OOPS! (OntOlogy Pitfall Scanner!).
En: "18th International Conference, EKAW 2012", 08/10/2012 - 12/10/2012, Galway City, Ireland. pp..
| Título: | Did you evaluate your ontology? OOPS! (OntOlogy Pitfall Scanner!) |
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| Autor/es: |
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| Tipo de Documento: | Ponencia en Congreso o Jornada (Póster) |
| Título del Evento: | 18th International Conference, EKAW 2012 |
| Fechas del Evento: | 08/10/2012 - 12/10/2012 |
| Lugar del Evento: | Galway City, Ireland |
| Título del Libro: | Proceedings 18th International Conference, EKAW 2012 |
| Fecha: | 2012 |
| Materias: | |
| ODS: | |
| Escuela: | Facultad de Informática (UPM) [antigua denominación] |
| Departamento: | Inteligencia Artificial |
| Licencias Creative Commons: | Reconocimiento - Sin obra derivada - No comercial |
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The application of methodologies for building ontologies can improve ontology quality. However, such quality is not guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or bad practices within the ontology development. In this context, our aim is to describe OOPS!(OntOlogy Pitfall Scanner!), a tool for detecting pitfalls in ontologies.
| ID de Registro: | 20287 |
|---|---|
| Identificador DC: | https://oa.upm.es/20287/ |
| Identificador OAI: | oai:oa.upm.es:20287 |
| Depositado por: | Memoria Investigacion |
| Depositado el: | 23 Oct 2013 14:55 |
| Ultima Modificación: | 22 May 2024 06:59 |
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