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ORCID: https://orcid.org/0000-0003-4560-285X, Lucas Hernandez, Marcos, Gómez Aguilera, Enrique Javier
ORCID: https://orcid.org/0000-0001-6998-1407 and Moreno del Pozo, Jose
(2012).
Technical evaluation of a third generation optical pose tracker for motion analysis and image-guided surgery.
En: "15th International Conference on Medical Image Computing and Computer Assisted Intervention (MICCAI 2012)", 01/10/2012 - 05/10/2012, Niza, Francia. pp..
| Título: | Technical evaluation of a third generation optical pose tracker for motion analysis and image-guided surgery |
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| Autor/es: |
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| Tipo de Documento: | Ponencia en Congreso o Jornada (Artículo) |
| Título del Evento: | 15th International Conference on Medical Image Computing and Computer Assisted Intervention (MICCAI 2012) |
| Fechas del Evento: | 01/10/2012 - 05/10/2012 |
| Lugar del Evento: | Niza, Francia |
| Título del Libro: | International Conference on Medical Image Computing and Computer Assisted Intervention (MICCAI 2012) |
| Fecha: | 2012 |
| Materias: | |
| ODS: | |
| Palabras Clave Informales: | Laparoscopic tool tracking, Optical pose tracker, Motion analysis, Image-guided surgery. |
| Escuela: | E.T.S.I. Telecomunicación (UPM) |
| Departamento: | Tecnología Fotónica [hasta 2014] |
| Licencias Creative Commons: | Reconocimiento - Sin obra derivada - No comercial |
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Laparoscopic instrument tracking systems are an essential component in image-guided interventions and offer new possibilities to improve and automate objective assessment methods of surgical skills. In this study we present our system design to apply a third generation optical pose tracker (Micron- Tracker®) to laparoscopic practice. A technical evaluation of this design is performed in order to analyze its accuracy in computing the laparoscopic instrument tip position. Results show a stable fluctuation error over the entire analyzed workspace. The relative position errors are 1.776±1.675 mm, 1.817±1.762 mm, 1.854±1.740 mm, 2.455±2.164 mm, 2.545±2.496 mm, 2.764±2.342 mm, 2.512±2.493 mm for distances of 50, 100, 150, 200, 250, 300, and 350 mm, respectively. The accumulated distance error increases with the measured distance. The instrument inclination covered by the system is high, from 90 to 7.5 degrees. The system reports a low positional accuracy for the instrument tip.
| ID de Registro: | 20434 |
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| Identificador DC: | https://oa.upm.es/20434/ |
| Identificador OAI: | oai:oa.upm.es:20434 |
| Depositado por: | Memoria Investigacion |
| Depositado el: | 06 Oct 2013 10:11 |
| Ultima Modificación: | 21 May 2024 14:23 |
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