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ORCID: https://orcid.org/0000-0002-3833-524X, Ituero Herrero, Pablo
ORCID: https://orcid.org/0000-0001-6448-7936 and López Barrio, Carlos Alberto
ORCID: https://orcid.org/0000-0002-2423-5272
(2012).
A CAD framework for the characterization and use of Memristor models.
En: "2012 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2012 International Conference on", 19/09/2012 - 21/09/2012, Sevilla. ISBN 978-1-4673-0685-0. pp. 25-28.
https://doi.org/10.1109/SMACD.2012.6339408.
| Título: | A CAD framework for the characterization and use of Memristor models |
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| Autor/es: |
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| Tipo de Documento: | Ponencia en Congreso o Jornada (Artículo) |
| Título del Evento: | 2012 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2012 International Conference on |
| Fechas del Evento: | 19/09/2012 - 21/09/2012 |
| Lugar del Evento: | Sevilla |
| Título del Libro: | 2012 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) |
| Fecha: | Septiembre 2012 |
| ISBN: | 978-1-4673-0685-0 |
| Materias: | |
| ODS: | |
| Escuela: | E.T.S.I. Telecomunicación (UPM) |
| Departamento: | Ingeniería Electrónica |
| Licencias Creative Commons: | Reconocimiento - Sin obra derivada - No comercial |
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In the recent years the missing fourth component, the memristor, was successfully synthesized. However, the mathematical complexity and variety of the models behind this component, in addition to the existence of convergence problems in the simulations, make the design of memristor-based applications long and difficult. In this work we present a memristor model characterization framework which supports the automated generation of subcircuit files. The proposed environment allows the designer to choose and parameterize the memristor model that best suits for a given application. The framework carries out characterizing simulations in order to study the possible non-convergence problems, solving the dependence on the simulation conditions and guaranteeing the functionality and performance of the design. Additionally, the occurrence of undesirable effects related to PVT variations is also taken into account. By performing a Monte Carlo or a corner analysis, the designer is aware of the safety margins which assure the correct device operation.
| ID de Registro: | 20502 |
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| Identificador DC: | https://oa.upm.es/20502/ |
| Identificador OAI: | oai:oa.upm.es:20502 |
| Identificador DOI: | 10.1109/SMACD.2012.6339408 |
| URL Oficial: | http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumb... |
| Depositado por: | Memoria Investigacion |
| Depositado el: | 07 Oct 2013 16:43 |
| Ultima Modificación: | 21 Abr 2016 23:20 |
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