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ORCID: https://orcid.org/0000-0003-1872-7243, Orlando Carrillo, Vincenzo, Núñez Mendoza, Neftalí
ORCID: https://orcid.org/0000-0003-2339-2441, Vázquez López, Manuel
ORCID: https://orcid.org/0000-0003-1070-1751, Bautista Villares, Jesus, Xiugang, He, Barrutia Poncela, Laura
ORCID: https://orcid.org/0000-0001-9363-6662, Rey-Stolle Prado, Ignacio
ORCID: https://orcid.org/0000-0002-4919-5609 and Araki, Kenji
(2012).
Preliminary temperature Accelerated Life Test (ALT) on III-V commercial concentrator triple-junction solar cells.
En: "38th IEEE Photovoltaic Specialists Conference (PVSC), 2012", 03/06/2012 - 08/06/2012, Austin, Texas (USA). pp..
| Título: | Preliminary temperature Accelerated Life Test (ALT) on III-V commercial concentrator triple-junction solar cells |
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| Autor/es: |
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| Tipo de Documento: | Ponencia en Congreso o Jornada (Artículo) |
| Título del Evento: | 38th IEEE Photovoltaic Specialists Conference (PVSC), 2012 |
| Fechas del Evento: | 03/06/2012 - 08/06/2012 |
| Lugar del Evento: | Austin, Texas (USA) |
| Título del Libro: | 38th IEEE Photovoltaic Specialists Conference (PVSC), 2012 |
| Fecha: | Junio 2012 |
| Materias: | |
| ODS: | |
| Palabras Clave Informales: | Accelerated life test, ALT, reliability, concentration, solar cells, III-V, CPV, Photovoltaics |
| Escuela: | Instituto de Energía Solar (IES) (UPM) |
| Departamento: | Otro |
| Licencias Creative Commons: | Reconocimiento - Sin obra derivada - No comercial |
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A quantitative temperature accelerated life test on sixty GaInP/GaInAs/Ge triple-junction commercial concentrator solar cells is being carried out. The final objective of this experiment is to evaluate the reliability, warranty period, and failure mechanism of high concentration solar cells in a moderate period of time. The acceleration of the degradation is realized by subjecting the solar cells at temperatures markedly higher than the nominal working temperature under a concentrator Three experiments at three different temperatures are necessary in order to obtain the acceleration factor which relates the time at the stress level with the time at nominal working conditions. . However, up to now only the test at the highest temperature has finished. Therefore, we can not provide complete reliability information but we have analyzed the life data and the failure mode of the solar cells inside the climatic chamber at the highest temperature. The failures have been all of them catastrophic. In fact, the solar cells have turned into short circuits. We have fitted the failure distribution to a two parameters Weibull function. The failures are wear-out type. We have observed that the busbar and the surrounding fingers are completely deteriorate
| ID de Registro: | 20677 |
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| Identificador DC: | https://oa.upm.es/20677/ |
| Identificador OAI: | oai:oa.upm.es:20677 |
| Depositado por: | Memoria Investigacion |
| Depositado el: | 09 Oct 2013 16:12 |
| Ultima Modificación: | 05 Mar 2024 15:13 |
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