Ratio-based temperature-sensing technique hardened against nanometer process variations

Ituero Herrero, Pablo ORCID: https://orcid.org/0000-0001-6448-7936 and López Vallejo, Marisa ORCID: https://orcid.org/0000-0002-3833-524X (2013). Ratio-based temperature-sensing technique hardened against nanometer process variations. "IEEE Sensors Journal", v. 13 (n. 2); pp. 442-443. ISSN 1530-437X. https://doi.org/10.1109/JSEN.2012.2227713.

Descripción

Título: Ratio-based temperature-sensing technique hardened against nanometer process variations
Autor/es:
Tipo de Documento: Artículo
Título de Revista/Publicación: IEEE Sensors Journal
Fecha: Febrero 2013
ISSN: 1530-437X
Volumen: 13
Número: 2
Materias:
ODS:
Palabras Clave Informales: Leakage, process variations, ratio-based, sensor, temperature, time-to-digital
Escuela: E.T.S.I. Telecomunicación (UPM)
Departamento: Ingeniería Electrónica
Licencias Creative Commons: Reconocimiento - Sin obra derivada - No comercial

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Resumen

This letter presents a temperature-sensing technique on the basis of the temperature dependency of MOSFET leakage currents. To mitigate the effects of process variation, the ratio of two different leakage current measurements is calculated. Simulations show that this ratio is robust to process spread. The resulting sensor is quite small-0.0016 mm2 including an analog-to-digital conversion-and very energy efficient, consuming less than 640 pJ/conversion. After a two-point calibration, the accuracy in a range of 40°C-110°C is less than 1.5°C , which makes the technique suitable for thermal management applications.

Más información

ID de Registro: 29554
Identificador DC: https://oa.upm.es/29554/
Identificador OAI: oai:oa.upm.es:29554
URL Portal Científico: https://portalcientifico.upm.es/es/ipublic/item/5488240
Identificador DOI: 10.1109/JSEN.2012.2227713
URL Oficial: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?...
Depositado por: Memoria Investigacion
Depositado el: 06 Jul 2014 10:26
Ultima Modificación: 12 Nov 2025 00:00