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ORCID: https://orcid.org/0000-0001-6448-7936 and López Vallejo, Marisa
ORCID: https://orcid.org/0000-0002-3833-524X
(2013).
Ratio-based temperature-sensing technique hardened against nanometer process variations.
"IEEE Sensors Journal", v. 13
(n. 2);
pp. 442-443.
ISSN 1530-437X.
https://doi.org/10.1109/JSEN.2012.2227713.
| Título: | Ratio-based temperature-sensing technique hardened against nanometer process variations |
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| Autor/es: |
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| Tipo de Documento: | Artículo |
| Título de Revista/Publicación: | IEEE Sensors Journal |
| Fecha: | Febrero 2013 |
| ISSN: | 1530-437X |
| Volumen: | 13 |
| Número: | 2 |
| Materias: | |
| ODS: | |
| Palabras Clave Informales: | Leakage, process variations, ratio-based, sensor, temperature, time-to-digital |
| Escuela: | E.T.S.I. Telecomunicación (UPM) |
| Departamento: | Ingeniería Electrónica |
| Licencias Creative Commons: | Reconocimiento - Sin obra derivada - No comercial |
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This letter presents a temperature-sensing technique on the basis of the temperature dependency of MOSFET leakage currents. To mitigate the effects of process variation, the ratio of two different leakage current measurements is calculated. Simulations show that this ratio is robust to process spread. The resulting sensor is quite small-0.0016 mm2 including an analog-to-digital conversion-and very energy efficient, consuming less than 640 pJ/conversion. After a two-point calibration, the accuracy in a range of 40°C-110°C is less than 1.5°C , which makes the technique suitable for thermal management applications.
| ID de Registro: | 29554 |
|---|---|
| Identificador DC: | https://oa.upm.es/29554/ |
| Identificador OAI: | oai:oa.upm.es:29554 |
| URL Portal Científico: | https://portalcientifico.upm.es/es/ipublic/item/5488240 |
| Identificador DOI: | 10.1109/JSEN.2012.2227713 |
| URL Oficial: | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?... |
| Depositado por: | Memoria Investigacion |
| Depositado el: | 06 Jul 2014 10:26 |
| Ultima Modificación: | 12 Nov 2025 00:00 |
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