Effect of van der Waals interaction on the properties of SnS2 layered semiconductor

Seminóvski Pérez, Yohanna, Palacios Clemente, Pablo ORCID: https://orcid.org/0000-0001-7867-8880 and Wahnón Benarroch, Perla ORCID: https://orcid.org/0000-0002-5420-2906 (2013). Effect of van der Waals interaction on the properties of SnS2 layered semiconductor. "Thin Solid Films", v. 535 ; pp. 387-389. ISSN 0040-6090. https://doi.org/10.1016/j.tsf.2012.11.112.

Descripción

Título: Effect of van der Waals interaction on the properties of SnS2 layered semiconductor
Autor/es:
Tipo de Documento: Artículo
Título de Revista/Publicación: Thin Solid Films
Fecha: 2013
ISSN: 0040-6090
Volumen: 535
Materias:
ODS:
Palabras Clave Informales: DFT, Intermediate-band, Solar cell, SnS2
Escuela: Instituto de Energía Solar (IES) (UPM)
Departamento: Tecnologías Especiales Aplicadas a la Aeronáutica [hasta 2014]
Licencias Creative Commons: Reconocimiento - Sin obra derivada - No comercial

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Resumen

Nowadays, dispersion correction applied on layered semiconductors is a topic of interest. Among the known layered semiconductors, SnS2 polytypes are wide gap semiconductors with a van der Waals interaction between their layers, which could form good materials to be used in photovoltaic applications. The present work gives an approach to the SnS2 geometrical and electronic characterization using an empirical dispersion correction added to the Perdew–Burke–Ernzerhof functional and subsequent actualization of the electronic charge density using the screened hybrid Heyd–Scuseria–Ernzerhof functional using a density functional code. The obtained interlayer distance and band-gap are in good agreement with experimental values when van der Waals dispersion forces are included.

Más información

ID de Registro: 33258
Identificador DC: https://oa.upm.es/33258/
Identificador OAI: oai:oa.upm.es:33258
URL Portal Científico: https://portalcientifico.upm.es/es/ipublic/item/5488535
Identificador DOI: 10.1016/j.tsf.2012.11.112
URL Oficial: http://www.sciencedirect.com/science/article/pii/S...
Depositado por: Memoria Investigacion
Depositado el: 26 Ene 2015 17:28
Ultima Modificación: 12 Nov 2025 00:00