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A tool for the automatic analysis of single events effects on electronic circuits
Cita
García Redondo, Fernando, López Vallejo, Marisa, Royer del Barrio, Pablo and Agustín Sáenz, Javier 
ORCID: https://orcid.org/0000-0002-8588-4508
(2014).
A tool for the automatic analysis of single events effects on electronic circuits.
En: "5th European Workshop on CMOS Variability (VARI 2014)", 29/09/2014 - 01/10/2014, Palma de Mallorca, Spain. pp. 1-6.
https://doi.org/10.1109/VARI.2014.6957082.
ORCID: https://orcid.org/0000-0002-8588-4508
(2014).
A tool for the automatic analysis of single events effects on electronic circuits.
En: "5th European Workshop on CMOS Variability (VARI 2014)", 29/09/2014 - 01/10/2014, Palma de Mallorca, Spain. pp. 1-6.
https://doi.org/10.1109/VARI.2014.6957082.
Descripción
| Título: | A tool for the automatic analysis of single events effects on electronic circuits |
|---|---|
| Autor/es: |
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| Tipo de Documento: | Ponencia en Congreso o Jornada (Artículo) |
| Título del Evento: | 5th European Workshop on CMOS Variability (VARI 2014) |
| Fechas del Evento: | 29/09/2014 - 01/10/2014 |
| Lugar del Evento: | Palma de Mallorca, Spain |
| Título del Libro: | 5th European Workshop on CMOS Variability (VARI 2014) |
| Fecha: | 2014 |
| Materias: | |
| ODS: | |
| Escuela: | E.T.S.I. Telecomunicación (UPM) |
| Departamento: | Ingeniería Electrónica |
| Licencias Creative Commons: | Reconocimiento - Sin obra derivada - No comercial |
Resumen
Nowadays integrated circuit reliability is challenged by both variability and working conditions. Environmental radiation has become a major issue when ensuring the circuit correct behavior. The required radiation and later analysis performed to the circuit boards is both fund and time expensive. The lack of tools which support pre-manufacturing radiation hardness analysis hinders circuit designers tasks. This paper describes an extensively customizable simulation tool for the characterization of radiation effects on electronic systems. The proposed tool can produce an in depth analysis of a complete circuit in almost any kind of radiation environment in affordable computation times.
Más información
| ID de Registro: | 36611 |
|---|---|
| Identificador DC: | https://oa.upm.es/36611/ |
| Identificador OAI: | oai:oa.upm.es:36611 |
| Identificador DOI: | 10.1109/VARI.2014.6957082 |
| Depositado por: | Memoria Investigacion |
| Depositado el: | 22 Jul 2015 17:04 |
| Ultima Modificación: | 29 Ene 2023 09:49 |
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