A tool for the automatic analysis of single events effects on electronic circuits

García Redondo, Fernando and López Vallejo, Marisa and Royer del Barrio, Pablo and Agustín Saenz, Javier (2014). A tool for the automatic analysis of single events effects on electronic circuits. In: "5th European Workshop on CMOS Variability (VARI 2014)", 29/09/2014 - 01/10/2014, Palma de Mallorca, Spain. pp. 1-6. https://doi.org/10.1109/VARI.2014.6957082.

Description

Title: A tool for the automatic analysis of single events effects on electronic circuits
Author/s:
  • García Redondo, Fernando
  • López Vallejo, Marisa
  • Royer del Barrio, Pablo
  • Agustín Saenz, Javier
Item Type: Presentation at Congress or Conference (Article)
Event Title: 5th European Workshop on CMOS Variability (VARI 2014)
Event Dates: 29/09/2014 - 01/10/2014
Event Location: Palma de Mallorca, Spain
Title of Book: 5th European Workshop on CMOS Variability (VARI 2014)
Date: 2014
Subjects:
Faculty: E.T.S.I. Telecomunicación (UPM)
Department: Ingeniería Electrónica
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

Nowadays integrated circuit reliability is challenged by both variability and working conditions. Environmental radiation has become a major issue when ensuring the circuit correct behavior. The required radiation and later analysis performed to the circuit boards is both fund and time expensive. The lack of tools which support pre-manufacturing radiation hardness analysis hinders circuit designers tasks. This paper describes an extensively customizable simulation tool for the characterization of radiation effects on electronic systems. The proposed tool can produce an in depth analysis of a complete circuit in almost any kind of radiation environment in affordable computation times.

More information

Item ID: 36611
DC Identifier: http://oa.upm.es/36611/
OAI Identifier: oai:oa.upm.es:36611
DOI: 10.1109/VARI.2014.6957082
Deposited by: Memoria Investigacion
Deposited on: 22 Jul 2015 17:04
Last Modified: 22 Jul 2015 17:04
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