Module optical analyzer: Identification of defects on the production line

Herrero Martin, Rebeca and Askins, Stephen and Anton Hernandez, Ignacio and Sala Pano, Gabriel and Araki, Kenji and Nagai, Hirokazu (2014). Module optical analyzer: Identification of defects on the production line. In: "10th International Conference on Concentrator Photovoltaic Systems (CPV-10)", 07/04/2014 - 09/04/2014, Albuquerque, New Mexico, USA. pp. 119-123. https://doi.org/10.1063/1.4897042.

Description

Title: Module optical analyzer: Identification of defects on the production line
Author/s:
  • Herrero Martin, Rebeca
  • Askins, Stephen
  • Anton Hernandez, Ignacio
  • Sala Pano, Gabriel
  • Araki, Kenji
  • Nagai, Hirokazu
Item Type: Presentation at Congress or Conference (Article)
Event Title: 10th International Conference on Concentrator Photovoltaic Systems (CPV-10)
Event Dates: 07/04/2014 - 09/04/2014
Event Location: Albuquerque, New Mexico, USA
Title of Book: 10th International Conference on Concentrator Photovoltaic Systems (CPV-10)
Título de Revista/Publicación: AIP Conference Proceedings
Date: 2014
Subjects:
Freetext Keywords: Solar concentrators, characterization, CCD
Faculty: Instituto de Energía Solar (IES) (UPM)
Department: Electrónica Física
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

The usefulness of the module optical analyzer when identifying module defects on production line is presented in this paper. Two different case studies performed with two different kind of CPV modules are presented to show the use of MOA both in IES-UPM and Daido Steel facilities.

Funding Projects

TypeCodeAcronymLeaderTitle
FP7283798NGCPVUNIVERSIDAD POLITECNICA DE MADRIDA new generation of concentrator photovoltaic cells, modules and systems
Madrid Regional GovernmentS2009/ENE-1477UnspecifiedUnspecifiedUnspecified

More information

Item ID: 38845
DC Identifier: http://oa.upm.es/38845/
OAI Identifier: oai:oa.upm.es:38845
DOI: 10.1063/1.4897042
Deposited by: Memoria Investigacion
Deposited on: 18 Jan 2016 17:31
Last Modified: 18 Jan 2016 17:50
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