Determination of a refractive index and an extinction coefficient of standard production of CVD-graphene

Ochoa Martínez, Efraín and Gabás, M. and Barrutia Poncela, Laura and Pesquera, Amalia and Centeno, Alba and Palanco, S. and Zurutuza, Amaia and Algora del Valle, Carlos (2015). Determination of a refractive index and an extinction coefficient of standard production of CVD-graphene. "Nanoscale", v. 7 (n. 4); pp. 1491-1500. ISSN 2040-3364. https://doi.org/10.1039/C4NR06119E.

Description

Title: Determination of a refractive index and an extinction coefficient of standard production of CVD-graphene
Author/s:
  • Ochoa Martínez, Efraín
  • Gabás, M.
  • Barrutia Poncela, Laura
  • Pesquera, Amalia
  • Centeno, Alba
  • Palanco, S.
  • Zurutuza, Amaia
  • Algora del Valle, Carlos
Item Type: Article
Título de Revista/Publicación: Nanoscale
Date: 2015
ISSN: 2040-3364
Volume: 7
Subjects:
Faculty: E.T.S.I. Telecomunicación (UPM)
Department: Electrónica Física
Creative Commons Licenses: Recognition - No derivative works - Non commercial

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Abstract

The refractive index and extinction coefficient of chemical vapour deposition grown graphene are determined by ellipsometry analysis. Graphene films were grown on copper substrates and transferred as both monolayers and bilayers onto SiO2/Si substrates by using standard manufacturing procedures. The chemical nature and thickness of residual debris formed after the transfer process were elucidated using photoelectron spectroscopy. The real layered structure so deduced has been used instead of the nominal one as the input in the ellipsometry analysis of monolayer and bilayer graphene, transferred onto both native and thermal silicon oxide. The effect of these contamination layers on the optical properties of the stacked structure is noticeable both in the visible and the ultraviolet spectral regions, thus masking the graphene optical response. Finally, the use of heat treatment under a nitrogen atmosphere of the graphene-based stacked structures, as a method to reduce the water content of the sample, and its effect on the optical response of both graphene and the residual debris layer are presented. The Lorentz-Drude model proposed for the optical response of graphene fits fairly well the experimental ellipsometric data for all the analysed graphene-based stacked structures.

Funding Projects

TypeCodeAcronymLeaderTitle
Government of SpainTEC2011-28639-C02-01UnspecifiedUnspecifiedUnspecified
Government of SpainTEC2011-28639-C02-02UnspecifiedUnspecifiedUnspecified
Government of SpainIPT-2011-1408-420000UnspecifiedUnspecifiedUnspecified

More information

Item ID: 40868
DC Identifier: http://oa.upm.es/40868/
OAI Identifier: oai:oa.upm.es:40868
DOI: 10.1039/C4NR06119E
Official URL: http://pubs.rsc.org/en/Content/ArticleLanding/2015/NR/C4NR06119E#!divAbstract
Deposited by: Memoria Investigacion
Deposited on: 07 Jun 2016 15:54
Last Modified: 05 Jun 2019 16:32
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