Refractive indexes and extinction coefficients of n- and p-type doped GalnP, AllnP and AlGalnP for multijunction solar cells

Ochoa Martínez, Efraín, Barrutia Poncela, Laura ORCID: https://orcid.org/0000-0001-9363-6662, Ochoa Gómez, Mario ORCID: https://orcid.org/0000-0002-7108-3638, Barrigón Montañés, Enrique, García Vara, Iván ORCID: https://orcid.org/0000-0002-9895-2020, Rey-Stolle Prado, Ignacio ORCID: https://orcid.org/0000-0002-4919-5609, Algora del Valle, Carlos ORCID: https://orcid.org/0000-0003-1872-7243, Basa, Peter, Kronome, Gergely and Gabás, Mercedes (2017). Refractive indexes and extinction coefficients of n- and p-type doped GalnP, AllnP and AlGalnP for multijunction solar cells. "Solar Energy Materials And Solar Cells", v. 174 ; pp. 388-396. ISSN 0927-0248. https://doi.org/10.1016/j.solmat.2017.09.028.

Descripción

Título: Refractive indexes and extinction coefficients of n- and p-type doped GalnP, AllnP and AlGalnP for multijunction solar cells
Autor/es:
Tipo de Documento: Artículo
Título de Revista/Publicación: Solar Energy Materials And Solar Cells
Fecha: Septiembre 2017
ISSN: 0927-0248
Volumen: 174
Materias:
ODS:
Palabras Clave Informales: III-V semiconductor layers; Multijunction solar cells; Spectroscopic ellipsometry; Order parameter; Doped-GaInP (-AlInP, -AlGaInP)
Escuela: E.T.S.I. Telecomunicación (UPM)
Departamento: Electrónica Física
Licencias Creative Commons: Reconocimiento - Sin obra derivada - No comercial

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Resumen

The optical properties of p-type, n-type and nominally undoped (AlxGa1_x)yIn1_yP layers have been determined in a wide spectral range. The layers under study have been chosen with compositions and dopant concentrations which make them interesting for their use in III-V multijunction solar cells. The layers have been measured by variable angle spectroscopic ellipsometry and, irrespective of composition and doping, their optical response has been modelled using the same model dielectric function consisting of two asymmetric Tauc-Lorentz oscillators and a 3D-M0 Adachi term. The results show that transition energy values change with layer composition, whilst for layers of the same material (i.e. GaInP or AlInP), the band-gap transition energy E0 shows a strong dependence on the order parameter. The refractive indexes and extinction coefficients deduced from the ellipsometric data have been used to fit reflectance measurements for the same layers and an excellent agreement has been achieved, thus validating the model dielectric function proposed for this kind of materials.

Proyectos asociados

Tipo
Código
Acrónimo
Responsable
Título
Gobierno de España
TEC2014-54260-C3-1-P
MINECO
Sin especificar
Sin especificar
Gobierno de España
TEC2014-54260-C3-3-P
MINECO
Sin especificar
Sin especificar
Gobierno de España
PCIN- 2015-181-C02-01
MINECO
Sin especificar
Sin especificar
Gobierno de España
PCIN-2015-181-C02-02
MINECO
Sin especificar
Sin especificar
Comunidad de Madrid
S2013/MAE-2780
MADRID-PV
Sin especificar
Sin especificar

Más información

ID de Registro: 53480
Identificador DC: https://oa.upm.es/53480/
Identificador OAI: oai:oa.upm.es:53480
URL Portal Científico: https://portalcientifico.upm.es/es/ipublic/item/3110731
Identificador DOI: 10.1016/j.solmat.2017.09.028
URL Oficial: https://www.sciencedirect.com/science/article/pii/...
Depositado por: Memoria Investigacion
Depositado el: 26 Mar 2019 17:32
Ultima Modificación: 12 Nov 2025 00:00