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A Double Classification of Common Pitfalls in Ontologies
Cita
Poveda Villalón, María 
ORCID: https://orcid.org/0000-0003-3587-0367, Suárez-Figueroa, Mari Carmen ORCID: https://orcid.org/0000-0003-3807-5019 and Gómez-Pérez, A. ORCID: https://orcid.org/0000-0002-3037-0331
(2010).
A Double Classification of Common Pitfalls in Ontologies.
En: "Workshop on Ontology Quality (OntoQual 2010), Co-located with EKAW 2010", October 15, 2010, Lisbon, Portugal. ISBN ISSN 1613-0073.
ORCID: https://orcid.org/0000-0003-3587-0367, Suárez-Figueroa, Mari Carmen ORCID: https://orcid.org/0000-0003-3807-5019 and Gómez-Pérez, A. ORCID: https://orcid.org/0000-0002-3037-0331
(2010).
A Double Classification of Common Pitfalls in Ontologies.
En: "Workshop on Ontology Quality (OntoQual 2010), Co-located with EKAW 2010", October 15, 2010, Lisbon, Portugal. ISBN ISSN 1613-0073.
Descripción
| Título: | A Double Classification of Common Pitfalls in Ontologies |
|---|---|
| Autor/es: |
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| Tipo de Documento: | Ponencia en Congreso o Jornada (Artículo) |
| Título del Evento: | Workshop on Ontology Quality (OntoQual 2010), Co-located with EKAW 2010 |
| Fechas del Evento: | October 15, 2010 |
| Lugar del Evento: | Lisbon, Portugal |
| Título del Libro: | Proceedings of Workshop on Ontology Quality (OntoQual 2010), Co-located with EKAW 2010 |
| Fecha: | Octubre 2010 |
| ISBN: | ISSN 1613-0073 |
| Materias: | |
| ODS: | |
| Palabras Clave Informales: | oeg |
| Escuela: | Facultad de Informática (UPM) [antigua denominación] |
| Departamento: | Inteligencia Artificial |
| Grupo Investigación UPM: | Ontology Engineering Group – OEG |
| Licencias Creative Commons: | Ninguna |
Resumen
The application of methodologies for building ontologies has improved the ontology quality. However, such a quality is not totally guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or worst practices in the modelling. In this context, our aim in this paper is twofold: (1) to provide a catalogue of common worst practices, which we call pitfalls, and (2) to present a double classification of such pitfalls. These two products will serve in the ontology development in two ways: (a) to avoid the appearance of pitfalls in the ontology modelling, and (b) to evaluate and correct ontologies to improve their quality.
Más información
| ID de Registro: | 5413 |
|---|---|
| Identificador DC: | https://oa.upm.es/5413/ |
| Identificador OAI: | oai:oa.upm.es:5413 |
| Depositado por: | Dr Oscar Corcho |
| Depositado el: | 14 Dic 2010 11:20 |
| Ultima Modificación: | 22 May 2024 06:59 |
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