A Double Classification of Common Pitfalls in Ontologies

Poveda Villalon, Maria and Suárez-Figueroa, Mari Carmen and Gómez-Pérez, A. (2010). A Double Classification of Common Pitfalls in Ontologies. In: "Workshop on Ontology Quality (OntoQual 2010), Co-located with EKAW 2010", October 15, 2010, Lisbon, Portugal. ISBN ISSN 1613-0073.

Description

Title: A Double Classification of Common Pitfalls in Ontologies
Author/s:
  • Poveda Villalon, Maria
  • Suárez-Figueroa, Mari Carmen
  • Gómez-Pérez, A.
Item Type: Presentation at Congress or Conference (Article)
Event Title: Workshop on Ontology Quality (OntoQual 2010), Co-located with EKAW 2010
Event Dates: October 15, 2010
Event Location: Lisbon, Portugal
Title of Book: Proceedings of Workshop on Ontology Quality (OntoQual 2010), Co-located with EKAW 2010
Date: October 2010
ISBN: ISSN 1613-0073
Subjects:
Freetext Keywords: oeg
Faculty: Facultad de Informática (UPM)
Department: Inteligencia Artificial
UPM's Research Group: Ontology Engineering Group – OEG
Creative Commons Licenses: None

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Abstract

The application of methodologies for building ontologies has improved the ontology quality. However, such a quality is not totally guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or worst practices in the modelling. In this context, our aim in this paper is twofold: (1) to provide a catalogue of common worst practices, which we call pitfalls, and (2) to present a double classification of such pitfalls. These two products will serve in the ontology development in two ways: (a) to avoid the appearance of pitfalls in the ontology modelling, and (b) to evaluate and correct ontologies to improve their quality.

More information

Item ID: 5413
DC Identifier: http://oa.upm.es/5413/
OAI Identifier: oai:oa.upm.es:5413
Deposited by: Dr Oscar Corcho
Deposited on: 14 Dec 2010 11:20
Last Modified: 20 Apr 2016 14:13
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