Search for items in this repository.
Common Pitfalls in Ontology Development
Poveda Villalon, Maria and Suárez-Figueroa, Mari Carmen and Gómez-Pérez, A.
Common Pitfalls in Ontology Development.
In: "The 13th Conference of the Spanish Association for Artificial Intelligence, CAEPIA 2009", Noviembre 2009, Sevilla, España. ISBN 13 978-3-642-14263-5.
||Common Pitfalls in Ontology Development
Poveda Villalon, Maria
Suárez-Figueroa, Mari Carmen
Presentation at Congress or Conference
||The 13th Conference of the Spanish Association for Artificial Intelligence, CAEPIA 2009
|Title of Book:
||Current Topics in Artficial Intelligence, CAEPIA 2009 Selected
||Facultad de Informática (UPM)
|UPM's Research Group:
||Ontology Engineering Group – OEG
|Creative Commons Licenses:
The so-called Ontology Design Patterns (ODPs), which have been
defined as solutions to ontological design problems, are of great help to
developers when modelling ontologies since these patterns provide a
development guide and improve the quality of the resulting ontologies.
However, it has been demonstrated that, in many cases, developers encounter
difficulties when they have to reuse the correct design patterns and include
errors in the modelling. Thus, to avoid pitfalls in ontology modelling, this paper
proposes classifying errors into two types: (1) errors related to existing ODPs,
called anti-patterns, and (2) errors not related to existing ODPs, called pitfalls.
This classification is the result of analysing a set of ontologies. This paper is
focused on the pitfalls identified during the analysis. In addition the paper
presents a classification of the pitfalls found and a set of pitfall examples.
Check whether the anglo-saxon journal in which you have published an article allows you to also publish it under open access.
Check whether the spanish journal in which you have published an article allows you to also publish it under open access.