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Common Pitfalls in Ontology Development
Cita
Poveda Villalón, María 
ORCID: https://orcid.org/0000-0003-3587-0367, Suárez-Figueroa, Mari Carmen ORCID: https://orcid.org/0000-0003-3807-5019 and Gómez-Pérez, A. ORCID: https://orcid.org/0000-0002-3037-0331
(2010).
Common Pitfalls in Ontology Development.
En: "The 13th Conference of the Spanish Association for Artificial Intelligence, CAEPIA 2009", Noviembre 2009, Sevilla, España. ISBN 13 978-3-642-14263-5.
ORCID: https://orcid.org/0000-0003-3587-0367, Suárez-Figueroa, Mari Carmen ORCID: https://orcid.org/0000-0003-3807-5019 and Gómez-Pérez, A. ORCID: https://orcid.org/0000-0002-3037-0331
(2010).
Common Pitfalls in Ontology Development.
En: "The 13th Conference of the Spanish Association for Artificial Intelligence, CAEPIA 2009", Noviembre 2009, Sevilla, España. ISBN 13 978-3-642-14263-5.
Descripción
| Título: | Common Pitfalls in Ontology Development |
|---|---|
| Autor/es: |
|
| Tipo de Documento: | Ponencia en Congreso o Jornada (Artículo) |
| Título del Evento: | The 13th Conference of the Spanish Association for Artificial Intelligence, CAEPIA 2009 |
| Fechas del Evento: | Noviembre 2009 |
| Lugar del Evento: | Sevilla, España |
| Título del Libro: | Current Topics in Artficial Intelligence, CAEPIA 2009 Selected |
| Fecha: | 2010 |
| ISBN: | 13 978-3-642-14263-5 |
| Volumen: | LNAI 5 |
| Materias: | |
| ODS: | |
| Palabras Clave Informales: | oeg |
| Escuela: | Facultad de Informática (UPM) [antigua denominación] |
| Departamento: | Inteligencia Artificial |
| Grupo Investigación UPM: | Ontology Engineering Group – OEG |
| Licencias Creative Commons: | Ninguna |
Resumen
The so-called Ontology Design Patterns (ODPs), which have been
defined as solutions to ontological design problems, are of great help to
developers when modelling ontologies since these patterns provide a
development guide and improve the quality of the resulting ontologies.
However, it has been demonstrated that, in many cases, developers encounter
difficulties when they have to reuse the correct design patterns and include
errors in the modelling. Thus, to avoid pitfalls in ontology modelling, this paper
proposes classifying errors into two types: (1) errors related to existing ODPs,
called anti-patterns, and (2) errors not related to existing ODPs, called pitfalls.
This classification is the result of analysing a set of ontologies. This paper is
focused on the pitfalls identified during the analysis. In addition the paper
presents a classification of the pitfalls found and a set of pitfall examples.
Más información
| ID de Registro: | 6115 |
|---|---|
| Identificador DC: | https://oa.upm.es/6115/ |
| Identificador OAI: | oai:oa.upm.es:6115 |
| Depositado por: | Dr Oscar Corcho |
| Depositado el: | 22 Feb 2011 09:45 |
| Ultima Modificación: | 22 May 2024 06:59 |
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